Spectroscopic accessory with microscope illuminator
AssigneeHarrick Scientific Corp.
InventorsMilan Milosevic, Nicolas J. Harrick, Craig R. Wisch
Life of this patent
Estimating the term…
Abstract
An optical accessory for reflection spectroscopy having a very small sampling area and provided with a microscope for aiding the user to locate a sample to be analyzed on the active sampling area where it can interact with a radiation beam. The microscope is characterized by fiber optic bundles to supply sample illumination via a cone-shaped light-funnelling tip terminated in a thin hard optically transparent wear tip, e.g., of sapphire. The microscope is also used to apply pressure via the wear tip to the sample while it is being illuminated and while it can be viewed to maximize interaction with the radiation.
Claims31
A spectroscopic accessory for sample analysis comprising:
- (a) sample supporting means having an active sampling area,
- (b) means for directing an analyzing radiation beam to the active sampling area,
- (c) means for redirecting the analyzing radiation beam after interaction with a sample on the active sampling area,
- (d) means including an optically-transparent element for applying pressure for pressing a desired area of the sample against the active sampling area,
- (e) means for viewing under magnification through the optically-transparent element the desired area of the sample while the pressure is applied.
A spectroscopic accessory for sample analysis comprising:
- (a) sample supporting means having an active sampling area on the order of 1 mm and smaller than the area of the sample supporting means,
- (b) means for directing an analyzing radiation beam to the active sampling area,
- (c) means for redirecting the analyzing radiation beam after interaction with a sample on the active sampling area,
- (d) means for applying pressure for pressing a desired area of the sample against the active sampling area,
- (e) means for viewing under magnification the desired area of the sample relative to the active sampling area while the analyzing radiation is interacting with the sample for accurately aligning the desired area of the sample to the active sampling area.
A microscope for use with an optical analyzing accessory, said microscope comprising a light tube having a bottom and having an optical path extending vertically to the bottom, said light tube having at its bottom an optically transparent wear tip in the optical path, said wear tip being hard relative to an object below it to be viewed and having a diameter of about 1.5 mm or less such that a magnified view of an object of 1.5 mm or less below the tip while the tip is in contact with the object is obtained.
A spectroscopic accessory for sample analysis comprising:
- (a) sample supporting means having an active sampling area,
- (b) means for directing an analyzing radiation beam to the active sampling area,
- (c) means for redirecting the analyzing radiation beam after interaction with a sample on the active sampling area,
- (d) means for applying pressure for pressing a desired area of the sample against the active sampling area,
- (e) means for viewing under magnification the desired area of the sample while the pressure is applied,
- (f) means for varying the applied pressure.
A spectroscopic accessory for sample analysis comprising:
- (a) sample supporting means having an active sampling area,
- (b) means for directing an analyzing radiation beam to the active sampling area,
- (c) means for redirecting the analyzing radiation beam after interaction with a sample on the active sampling area,
- (d) means for applying pressure for pressing a desired area of the sample against the active sampling area, said means for applying pressure including optically transparent elements,
- (e) means for viewing under magnification the desired area of the sample while the pressure is applied.
A spectroscopic accessory for sample analysis comprising:
- (a) sample supporting means having an active sampling area smaller than the area of the sample supporting means,
- (b) means for directing an analyzing radiation beam to the active sampling area,
- (c) means for redirecting the analyzing radiation beam after interaction with a sample on the active sampling area,
- (d) means for applying pressure for pressing a desired area of the sample against the active sampling area,
- (e) means for viewing under magnification the desired area of the sample relative to the active sampling area for accurately aligning the desired area of the sample to the active sampling area,
- (f) the active sampling area being horizontally oriented,
- (g) the means for viewing comprising a microscope having an optical path extending vertically above the active sampling area and being provided at the active sampling area with an optically transparent, small diameter wear tip in the optical path such that a magnified view of the sample below the tip while the tip is in contact with the sample is obtained.
A spectroscopic accessory for sample analysis comprising:
- (a) sample supporting means having an active sampling area smaller than the area of the sample supporting means, said sample supporting means comprising a hemisphere,
- (b) means for directing an analyzing radiation beam to the active sampling area,
- (c) means for redirecting the analyzing radiation beam after interaction with a sample on the active sampling area,
- (d) means for applying pressure for pressing a desired area of the sample against the active sampling area,
- (e) means for viewing under magnification the desired area of the sample relative to the active sampling area for accurately aligning the desired area of the sample to the active sampling area.
A microscope for use with an optical analyzing accessory, said microscope comprising a light tube having a bottom and having an optical path extending vertically above the bottom of the light tube, said light tube having at its bottom an optically transparent, small diameter wear tip in the optical path such that a magnified view of an object below the tip while the tip is in contact with the object is obtained, means for applying pressure via the wear tip on the object.
A microscope for use with an optical analyzing accessory, said microscope comprising a light tube having an optical path extending vertically above a bottom of the light tube, said light tube having at its bottom an optically transparent, small diameter wear tip in the optical path such that a magnified view of an object below the tip while the tip is in contact with the object is obtained, means for laterally moving the microscope a small distance relative to the object to be viewed.
Dependencies are inferred from the claim text.