High resolution observation apparatus with photon scanning microscope

A high resolution observation apparatus with a photon scanning microscope comprising:

• an optical device having a surface on which a sample to be observed is coated;
• an optical source for generating an incident light of a predetermined wavelength to be incident to the sample through the optical device at a total reflection angle which is defined by refraction indices of the optical device and the sample;
• an optical detecting probe having an opening at a tip of the probe for receiving a sample light emitted from the sample surface in response to the incident light;
• an optical detecting system for detecting the sample light received by the optical detecting probe having different wavelengths than the predetermined wavelength of the incident light;
• an x and y-axis control unit for moving the optical detecting probe to scan the sample surface over a two-dimentional area to be observed;
• and
• a z-axis control unit for positioning the optical detecting probe at a distance above the sample surface close enough to detect the sample light and for controlling a position of the optical detecting probe so as to keep a positioning signal detected by the optical detecting system constant during a course of scanning the sample surface over the two-dimensional area to be observed.