Testing device control system for detecting testing device failure
AssigneeFujitsu Limited
InventorMasamichi Kawasoe
Life of this patent
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AssigneeFujitsu Limited
InventorMasamichi Kawasoe
Estimating the term…
A testing device control system capable of automatically detecting failures in the pallets for carrying products to be tested as well as failures in automatic testing devices along with the cables for connecting the pallets to the devices. A host computer is connected to a disc unit that contains for each testing device a plurality of testing item files, a detected testing device failure file, a detected pallet failure file and a testing device failure control file. For each testing device, a first defect item writing device writes to the disc unit the defect items of the product measured by a plurality of automatic testing devices. In addition, the number of the same defect items counted by the same automatic testing device is written to the disc unit. If the defect item count exceeds a predetermined value, failure information is written to the testing device failure control file and is displayed on a display unit.
A testing device control system comprising:
Dependencies are inferred from the claim text.