Thermal measuring and testing system having synchronized sample transporting means
AssigneeSeiko Instruments Inc.
InventorHaruo Takeda
Life of this patent
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AssigneeSeiko Instruments Inc.
InventorHaruo Takeda
Estimating the term…
A thermal analysis device with a sample transporting machine which automatically carries out pretreatment of a sample to quickly heat or cool it. The configuration includes an electric furnace, a temperature controller, a temperature program setter, a sample placing/removing program setter, and a sample transporter, wherein the said sample placing/removing program setter commands the said sample transporter to place the said sample in or remove it from the said electric furnace in synchronization with a synchronization signal from the said temperature program setter and in accordance with a preset sample placing/removing program and, hence, the said sample placing and removing operations (i.e. to place a sample in the electric furnace or, conversely to remove a sample from the electric furnace) are carried out in the electric furnace which is performing a heating operation or a cooling operation in accordance with a temperature program output by the said temperature program setter.
In a thermal measuring and testing system adapted to provide temperature data for analysis on a sample to be tested, the improvement wherein said thermal measuring and testing system comprises:
Dependencies are inferred from the claim text.