Means and method for characterizing high power, ultra short laser pulses in a real time, on line manner
AssigneeAssociated Universities, Inc.
InventorJames T. Veligdan
Life of this patent
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AssigneeAssociated Universities, Inc.
InventorJames T. Veligdan
Estimating the term…
An ultra short (<10 ps), high power laser pulse is temporally characterized by a system that uses a physical measurement of a wavefront that has been altered in a known manner. The system includes a first reflection switch to remove a portion of a pulse from a beam of pulses, then includes a second reflection switch, operating in a mode that is opposite to the first reflection switch, to slice off a portion of that removed portion. The sliced portion is then directed to a measuring device for physical measurement. The two reflection switches are arranged with respect to each other and with respect to the beam of ultra short pulses such that physical measurement of the sliced portion is related to the temporal measurement of the ultra short pulse by a geometric or trigonometric relationship. The reflection switches are operated by a control pulse that is directed to impinge on each of the reflection switches at a 90.degree. angle of incidence.
Apparatus means for characterizing the pulse length of an ultra short laser pulse comprising:
A method of characterizing short laser pulses comprising:
A method of characterizing high power, ultra short laser pulses in a real time, on line manner comprising steps of:
A method of characterizing short laser pulses comprising:
Dependencies are inferred from the claim text.