US 5,293,341 AGranted

Semiconductor memory having a test function

AssigneeNEC Corporation

InventorAkira Tsujimoto

Life of this patent

Estimating the term…

Loading patent…

Abstract

A first test mode signal generating circuit detects, at a timing at which a row address strobe signal changes from an inactive level, to an active level that a column address strobe signal and a write control signal are at an active level to generate an active first test mode signal. A control signal generating circuit detects, during a period in which the row address strobe signal is at the active level, that the column address strobe signal changes from an active level, through an inactive level, and to the active level again to generate an active control signal. A second test mode signal generating circuit generates an active second test mode signal when the first test mode signal and the control signal are at the active level. The first test circuit tests a memory circuit in response to output of the active first test mode signal, and a second test circuit tests the memory circuit in response to output of the active second test mode signal.

Claims4

Dependent claims

A semiconductor memory device, comprising:

a first test mode signal generating circuit for receiving a row address strobe signal, a column address strobe signal, and a write control signal, and for detecting, at a timing at which the row address strobe signal changes from an inactive level to an active level, that the column address strobe signal and the write control signal are at an active level to output an active first test mode signal;
a control signal generating circuit for receiving the row address strobe signal and the column address strobe signal, and for detecting, during a period in which the row address strobe signal is at the active level, that the column address strobe signal changes from the active level, through the inactive level, and then the active level again to generate the active control signal;
a memory circuit for storing data;
a first test circuit, coupled to the first test mode signal generating circuit and the memory circuit, for testing the memory circuit in response to output of the active first test mode signal;
and
a second test circuit, coupled to the second test mode signal generating circuit and the memory circuit, for testing the memory circuit in response to output of the active second test mode signal.

3 more elements

Dependencies are inferred from the claim text.