Measurment of shot peening coverage by impact dent characterization
AssigneeGeneral Electric Company
InventorsRobert A. Thompson, Mark A. Tascillo
Life of this patent
Estimating the term…
Abstract
This invention relates to measuring shot peening coverage by impact dent characterization. Such methods of this type employ a non-destructive, automated computer analysis by analyzing dent characteristics to determine shot coverage of a particular surface.
Claims2
A method for measuring shot peening coverage having a substrate including a first side which has been surface treated by a shot peening operation, said method comprising the steps of:
- measuring a predetermined area of said surface treatment on said first side to obtain profile data;
- recording said profile data;
- identifying impact dent data in said predetermined area;
- filtering said impact dent data to select at least one predetermined dent size and dent shape;
- calculating A,B,n, according to the equation ##EQU5## where .rho.=dimple density (dimples/in.sup.2) and x=coverage by comparing .rho. and x for at least three separate points;
- calculating .rho. for a predetermined shot density;
- determining actual shot peening coverage in said predetermined area;
- and
- adjusting, if needed, said surface treatment so that the actual coverage of a subsequently formed surface treated area is substantially in conformance with a predetermined desired coverage.
A method for measuring shot peening coverage having a substrate including a first side which has been surface treated by a shot peening operation, said method comprising the steps of:
- measuring a predetermined area of said surface treatment on said first side to obtain profile data;
- recording said profile data;
- identifying impact dent data in said predetermined area;
- filtering said impact dent data to select at least one predetermined dent size and dent shape;
- plotting a .rho. determination for a predetermined number of shot peening coverages where .rho.=dimple density (dimples/in.sup.2);
- establishing a .rho. versus x curve where x is said shot peening coverage;
- comparing at least one additional .rho. of a substrate which has been subsequently surface treated against said .rho. versus x curve to determine shot peening coverage (x) for said substrate which has been subsequently surface treated;
- determining an actual shot peening coverage in said predetermined area;
- and
- adjusting, if needed, said surface treatment so that the actual coverage of a subsequently formed surface treated area is substantially in conformance with a predetermined desired coverage.
Dependencies are inferred from the claim text.