Method and apparatus for generating test waveforms to be applied to a device under test
AssigneeHewlett-Packard Company
InventorsKiyoyasu Hiwada, Nobuyuki Kasuga
Life of this patent
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Abstract
A test waveform generator comprises a storage unit (1a , 1b) for storing timing information; a timing generator unit (2a, 2b) to which the timing information is input from the storage unit and which is adapted to output a timing pulse at a predetermined time on the basis of the timing information; and a waveform generating unit (3, 4) to which the pulse from the timing generator unit is input and which is adapted to output a test waveform. The timing generator unit is arranged so that the timing of the timing pulse is set with either (1) a period clock signal (CLK) serving as a reference or (2) another timing pulse serving as a reference.
Claims12
Apparatus for storing data defining test waveforms having a series of transitions and generating said test waveforms such that they may be applied to a device under test (DUT) during testing of said DUT by an IC tester, comprising:
- a) first storage means for storing first timing information defining rising edge transitions on the basis of a first reference signal, said first timing information including an indication of whether or not a first corresponding timing pulse is to be outputted and when relative to said first reference signal it is to be outputted;
- b) second storage means for storing second timing information defining falling edge transitions on the basis of a second reference signal, said second timing information including an indication of whether or not a second corresponding timing pulse is to be outputted and when relative to said second reference signal it is to be outputted;
- c) timing generator means, coupled to said first and second storage means, for generating timing pulses only at said transitions of said test waveform on the basis of said first and second timing information and said first and second reference signals, said timing generator means comprising first and second output terminals for outputting first and second timing pulses (TG1, TG2);
- and
- d) waveform generating means, coupled to said timing generator means, for generating test waveforms on the basis of said timing pulses, said waveform generating means comprising a flip-flop circuit, said flip-flop circuit comprising (1) a set input terminal (S) coupled to said first output terminal of said timing generator means, (2) a reset input terminal (R) coupled to said second output terminal of said timing generator means, and (3) an output terminal for outputting said test waveforms, said test waveforms being defined by said first and second timing pulses.
A method for storing data defining test waveforms having a series of transitions and generating said test waveforms such that they may be applied to a device under test (DUT) during testing of said DUT by an IC tester, comprising the steps of:
- a) storing first timing information defining rising edge transitions on the basis of a first reference signal, said first timing information including an indication of whether or not a first corresponding timing pulse is to be outputted and when relative to said first reference signal it is to be outputted;
- b) storing second timing information defining falling edge transitions on the basis of a second reference signal, said second timing information including an indication of whether or not a second corresponding timing pulse is to be outputted and when relative to said second reference signal it is to be outputted;
- c) generating timing pulses only at said transitions of said test waveform on the basis of said first and second timing information and said first and second reference signals;
- and
- d) generating test waveforms on the basis of said timing pulses, said test waveforms defined and generated by feeding said timing pulses to a flip-flop circuit and outputting said test waveforms from said flip-flop circuit.
Dependencies are inferred from the claim text.