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US 5,291,773 AGranted
Apparatus and method for ultrasonic detection of foreign materials in a specimen
AssigneeMitsubishi Denki Kabushiki Kaisha
InventorKazuya Kamon
Life of this patent
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Abstract
Foreign materials in a chemical specimen are detected by irradiating the chemical specimen with ultrasonic waves and detecting and monitoring scattered sound from the foreign materials in the chemical specimen. Even if the foreign materials are photosensitive substances which cannot be exposed to light, they can be detected.
Claims5
An apparatus for detecting foreign materials comprising:
- a container having a wall surrounding an observation region;
- an ultrasonic wave generator dispensed outside and spaced from the container for generating ultrasonic waves;
- sound directing means disposed between and spaced from the container and the wave generator for directing and condensing in the observation region the ultrasonic waves generated by the ultrasonic wave generator;
- a sound detector disposed outside of and spaced from the container for detecting ultrasonic waves;
- and
- sound projecting means disposed between and spaced from the container and the sound detector for projecting ultrasonic waves scattered from the observation region to the sound detector.
3 more elements
Dependencies are inferred from the claim text.