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US 5,291,422 AGranted
Broadband instrument for nondestructive measurement of material properties
AssigneeSGI International, Inc.
InventorErnest P. Esztergar
Life of this patent
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Abstract
An instrument for measuring the properties of materials. This nondestructive, noncontacting instrument detects electromagnetic radiation from the materials across a wide range of the electromagnetic spectrum, and combines these diverse data so as to derive the material property values desired. In particular, the properties detectable through particle magnetic resonance, spectroscopy of light in the infrared-visible-ultraviolet range, and detection of x-ray and gamma ray radiation may be included in the instrument. Sensors detect each wavelength band of electromagnetic radiation, and data from all of these sensors is merged in a central data processor to evaluate the material properties of interest.
Claims38
A multi-sensor device for analyzing at least one selected property of a material, the device comprising:
- (a) at least one sensor for detecting electromagnetic radiation coming from the material in a first selected wavelength band, the radiation being indiative of a first set of properties of the material, and for outputting signals containing information about the detected radiation;
- (b) at least one sensor for detecting electromagnetic radiation coming from the material in a second selected wavelength band, the radiation being indicative of a second set of properties of the material, and for outputting signals containing information about the detected radiation, wherein the first and second wavelength bands are sufficiently separated in wavelength that different information about the first and second sets of properties of the material is provided by such radiation;
- (c) a data processor, coupled to each of the sensors, for:
- (1) receiving, as input, the output signals from each of the sensors;
- (2) performing calculations on the received signals containing information from the first selected wavelength band to determine a first set of parameters relating to the first set of properties of the material;
- (3) performing calculations on the received signals containing information from the second selected wavelength band to determine a second set of parameters relating to the second set of properties of the material;
- (4) combining the first and second set of parameters to obtain a third set of parameters relating to at least one selected property of the material;
- and
- (5) producing, as output from the data processing device, values relating the third set of parameters to the at least one selected property of the material.
6 more elements
A multi-sensor device for analyzing at least one selected property of a material, the device comprising:
- (a) at least one first-type sensor for detecting electromagnetic radiation coming from the material, the radiation being indicative o a first set of properties of the material, and for outputting signals containing information about the detected radiation;
- (b) at least one second-type sensor for detecting electromagnetic radiation coming from the material, the radiation being indicative of a second set of properties of the material, and for outputting signals containing information about the detected radiation, wherein the first-type and second-type sensors are not of the same type and detect different information about the first and second sets of properties of the material from such radiation;
- (c) a data processor, coupled to each of the sensors, for:
- (1) receiving, as input, the output signals from each of the sensors;
- (2) performing calculations on the received signals containing information from the first-type sensors to determine a first set of parameters relating to the first set of properties of the material;
- (3) performing calculations on the received signals containing information from the second-type sensors to determine a second set of parameters relating to the second set of properties of the material;
- (4) combining the first and second set of parameters to obtain a third set of parameters relating to at least one selected property of the material;
- and
- (5) producing, as output from the data processing device, values relating the third set of parameters to the at least one selected property of the material.
6 more elements
A method for analyzing at least one selected property of a material using multiple electromagnetic radiation sensors, comprising the steps of:
- (a) detecting electromagnetic radiation coming from the material in a first selected wavelength band, the radiation being indicative of a first set of properties of the material, and outputting signals containing information about the detected radiation;
- (b) detecting electromagnetic radiation coming from the material in a second selected wavelength band, the radiation being indicative of a second set of properties of the material, and outputting signals containing information about the detected radiation, wherein the first and second wavelength bands are sufficiently separated in wavelength that different information about the first and second sets of properties of the material is provided by such radiation;
- (c) performing calculations in a data processing device on the output signals containing information from the first selected wavelength band to determine a first set of parameters relating to the first set of properties of the material;
- (d) performing calculations in the data processing device on the output signals containing information from the second selected wavelength band to determine a second set of parameters relating to the second set of properties of the material;
- (e) combining the first and second set of parameters in the data processing device to obtain a third set of parameters relating to at least one selected property of the material;
- and
- (f) producing, as output from the data processing device, values relating the third set of parameters to the at least one selected property of the material.
4 more elements
A method for analyzing at least one selected property of a material using multiple electromagnetic radiation sensors, comprising the steps of:
- (a) detecting electromagnetic radiation coming from the material using at least one first-type sensor, the radiation being indicative of a first set of properties of the material, and outputting signals containing information about the detected radiation;
- (b) detecting electromagnetic radiation coming from the material using at least one second-type sensor, the radiation being indicative of a second set of properties of the material, and outputting signals containing information about the detected radiation, wherein the first-type and second-type sensors are not of the same type and detect different information about the first and second sets of properties of the material from such radiation;
- (c) performing calculations in a data processing device on the output signals containing information from the first-type sensors to determine a first set of parameters relating to the first set of properties of the material;
- (d) performing calculations in the data processing device on the output signals containing information from the second-type sensors to determine a second set of parameters relating to the second set of properties of the material;
- (e) combining the first and second set of parameters in the data processing device to obtain a third set of parameters relating to at least one selected property of the material;
- and
- (f) producing, as output from the data processing device, values relating the third set of parameters to the at least one selected property of the material.
4 more elements
Dependencies are inferred from the claim text.