Electronic imaging device with defect correction

A method of improving the signal to noise response and of compensating for defective sensor elements in an electronic imaging device comprising first and second arrays of corresponding sensor elements that generate electrical signals in response to incident radiation, wherien said first and second arrays may includes some defective sensor elements, corresponding sensor elements of the first and second arrays being arranged in sensor element pairs aligned along a scanning direction, each of said pairs comprising at least one functional sensor element, said method comprising the steps of:

• a) identifying defective sensor elements in said first and second arrays;
• b) reading out the electrical signals generated by the sensor elements of said first and second arrays;
• c) summing the electrical signals generated by corresponding sensor elements of said sensor element pairs of first and second arrays when both sensor elements are functional;
• and amplifying the level of the electrical signal generated by a functional sensor element of a pair of first and second arrays, to a defect compensation level when the other element of said pair is not functional.

An electronic imaging device comprising:

• a) a plurality of at least four arrays of correspondents sensor elements that generate electrical signals in response to incident radiation wherein said plurality of four arrays is comprised of:
• a first array of red sensor elements;
• a second array of green sensor elements;
• a third array of blue sensor elements;
• and a fourth array of luminance sensor elements, corresponding sensor elements of said plurality of at least four arrays being arranged in sensor element sets, aligned along a scanning direction, the electrical signal from each sensor element of a set being a function of a combination of the electrical signals of the other sensor elements of said set, wherein said plurality of at least four arrays may include some defective sensor elements;
• b) a plurality of transfer means for carrying out the readout of the electrical signals generated by the sensor elements of said plurality of at least four arrays;
• c) defect identification means for identifying defective sensor elements in said plurality of at least four arrays;
• and
• d) output means comprising means for, in the event of a defective sensor element in one of said sensor element sets, generating a compensation signal for the defective sensor element, from the electrical signals of the functional sensor elements of said fourth array of luminance sensor elements.

A method of compensating for defective sensor elements in an electronic imaging device comprising a plurality of at least four arrays of corresponding sensor elements that generate electrical signals in response to incident radiation wherein said plurality of four arrays is comprised of:

• a first array of red sensor elements;
• a second array of green sensor elements;
• a third array of blue sensor elements;
• and a fourth array of luminance sensor elements corresponding sensor elements of said plurality of at least four arrays being arranged in sensor element sets aligned along a scanning direction, the electrical signals from each sensor element of a set being a function of a combination of the electrical signals of the other elements of said set, wherien said plurality of at least four arrays may include some defective sensor elements, said method comprising the steps of:
• a) identifying defective sensor elements in said plurality of at least four arrays;
• b) reading out the electrical signals generated by the sensor elements of said plurality of at least four arrays;
• c) in the event of a defective sensor element in one of said sensor element sets, generating a compensation signal for the defective sensor element from the electrical signals of the functional sensor elements of said fourth array of luminance sensor elements.