US 5,291,142 A · Method and apparatus for measuring the resistance of conductive materials due to electromigration

Abstract

A testing method and apparatus for conductive materials using electric current which makes it possible to rapidly evaluate the electromigration resistance of conductive materials. The apparatus includes a substrate support for supporting a substrate on which an interconnector pattern is formed, a cooling vessel for cooling the substrate, a first current supply for applying a first current to the interconnector, a resistance measurer for measuring the resistance of the interconnector pattern while the first electric current is being applied to the interconnector pattern, a second current supply for applying a second electric current larger than the first electric current to the interconnector pattern, and a controller which controls the repetition of the measurement of resistance of the interconnector pattern and the application of the second current to the interconnector pattern.

Claims13

Dependent claims

A method for measuring the resistance of a conductive material to electromigration, comprising the steps of:

providing an interconnector pattern made of a conductive material and being at a first temperature;
applying a first electric current to the interconnector pattern, wherein the applied current does not substantially heat the interconnector pattern to measure a first value of resistance of the interconnector pattern;
applying a second current to the interconnector pattern for a given period of time, wherein the second current is greater than the first current as maintaining the interconnector pattern at a substantially constant second temperature during the given period of time by cooling the interconnector pattern sufficiently to offset the effects of joule heating;
cooling the interconnector pattern to said first temperature after the given period of time;
applying the first electric current to the interconnector pattern to measure a second value of resistance of the interconnector pattern;
and
subtracting the first value from the second value to determine a difference of resistance, said difference being attributable to electromigration.

4 more elements

An apparatus for measuring the resistance of a conductive material to electromigration, comprising:

a substrate support for supporting a substrate;
an interconnector pattern comprising a conductive material formed on said substrate;
said substrate support being mounted on a cooling means for cooling said substrate support and said substrate;
first current supply means in electrical communication with said interconnector pattern for applying a first current to said interconnector pattern;
second current supply means in electrical communication with said interconnector pattern for applying a second electric current larger than said first electric current to said interconnector pattern, said second current being applied after said first current supply means is first applied;
resistance measuring means in electrical communication with said interconnector pattern for measuring the resistance of said interconnector pattern while said first current is being applied to said interconnector pattern;
and
a controller for controlling at least said first current supply means, said second current supply means, and said resistance measuring means so that the measurement of the resistance of said interconnector pattern and the application of said second electric current to cause electromigration are repeatedly carried out.

5 more elements

Dependencies are inferred from the claim text.

Method and apparatus for measuring the resistance of conductive materials due to electromigration

Life of this patent

Method and apparatus for measuring the resistance of conductive materials due to electromigration

Life of this patent

Abstract

Claims13