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US 5,291,127 AGranted
Chip-lifetime testing instrument for semiconductor devices
AssigneeSamsung Electronics Co., Ltd.
InventorsKhee Park, Jin H. Yoon, Oh S. Kwon, Gi Y. Jeon
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Abstract
A chip-lifetime testing instrument for semiconductor devices which can detect defective chips by testing the performance and electrical lifetime of the chips in manufacturing process of the semiconductor devices, so that the manufacturing cost can be reduced and unnecessary processes for packaging of defective chips can be avoided, thereby reducing the necessary space for the set-up of the testing instrument.
Claims7
An instrument for testing chips of semiconductor devices, comprising:
- a tray having a slot to hold a chip to be tested, said chip having an arrangement of electrodes thereon;
- a plurality of probes for contacting the electrodes on said chip;
- a substrate to which said probes are connected, said substrate having circuit patterns connected to said probes for electrical testing of said chip;
- said substrate being substantially flat and said probes projecting from said substrate substantially in the plane of said substrate, said probes having ends for contacting the electrodes;
- said substrate being selectively mountable on said tray for bringing said ends of the probes into contact with said electrodes;
- marking means on the chip and the substrate for indicating angular corresponding of the substrate and the chip and consequent correspondence of the probes and the electrodes;
- and
- means on said substrate for engaging said tray to align and fix the ends of said probes and said electrodes when the substrate is mounted on said tray.
5 more elements
Dependencies are inferred from the claim text.