Method to monitor Meta-Paete cure on metallized substrates

A manufacturing process, comprising the steps of:

• applying a coating of meta-paete polyimide film to a surface of a substrate, said surface of said substrate having a reflecting material thereon;
• partially curing said coating of meta-paete polyimide film;
• exposing said coating of meta-paete polyimide film to infrared radiation;
• monitoring the 1015 cm.sup.-1 and 1028 cm.sup.-1 bands reflected from said reflective surface positioned on said substrate under said meta-paete polyimide film;
• and
• calculating a ratio of the intensity of said 1028 cm.sup.-1 band to said 1015 cm.sup.-1 band.

A method for monitoring temperature uniformity in an oven cavity, comprising the steps of:

• applying coatings of meta-paete polyimide film to surfaces of a plurality of substrates, said surfaces of said substrates each having a reflecting material thereon;
• positioning said substrates at different locations inside an oven cavity;
• partially curing said coatings of meta-paete polyimide film;
• exposing said coatings of meta-paete polyimide film to infrared radiation;
• monitoring the 1015 cm.sup.-1 and 1028 cm.sup.-1 bands reflected from said reflective surfaces positioned on said substrates under said coatings of meta-paete polyimide film;
• calculating a ratio of the intensity of said 1028 cm.sup.-1 band to said 1015 cm.sup.-1 band for each of said substrates;
• determining if each ratio calculated in said calculating step is approximately equal, whereby approximately equal ratios indicate temperature uniformity within said oven cavity and unequal ratios indicate a lack of temperature uniformity within said oven cavity.