High density grid array test socket

A high density contact test socket comprising:

• a contact socket assembly having an insulative portion, said insulative portion having a plurality of holes disposed therein;
• a plurality of resilient contacts disposed in at least some of said plurality of holes, said plurality of resilient contacts each comprising a contact tip and a contact base;
• a cover adapted to be disposed on said contact socket assembly and adapted for applying sufficient pressure on a component installed in said contact socket assembly, said cover including a plurality of linearly actuatable snap latches disposed in opposed pairs, each of said plurality of linearly actuatable snap latches including a first inclined surface, a second inclined surface and a bottom surface, said first inclined surface contacting at least a portion of a device being installed in said test socket which linearly actuates and separates an opposed pair of snap latches, said bottom surface contacting at least a portion of said device to maintain said device in contact with each said contact tip of said plurality of resilient contacts and said second inclined surface being accessible to linearly actuate and separate at least one opposed pair of snap latches to permit removal of said device from said contact socket assembly, said cover further including a plurality of bushings, at least some of said bushings providing access to said second inclined surface of said snap latches.