Pick and place for automatic test handler

A pick and place for use in an automatic test handler in connection with an electronic device test system for removing electronic devices from one tray and transferring said electronic devices in a horizontal plane and placing them in another tray, comprising:

• a plurality of suction inlets for picking up said electronic devices from said one tray with a suction power and transferring them in a horizontal plane and placing said electronic devices on said other tray;
• a guide frame for slidably mounting said plurality of suction inlets in a horizontal direction;
• up and down means for providing up-and-down movement to said suction inlets for picking said electronic devices from said one tray and placing said devices in said other tray;
• space adjusting means for adjusting a difference in device spacing between said one tray and the other tray during a picking and placing operation, said space adjusting means including:
• a pantograph means which amplifies movement of a drive mechanism for providing a proportional space variation to said suction inlets;
• an air cylinder for driving said pantography mechanism by force of compressed air;
• and
• a variable stopper for adjusting said device spacing difference between said trays.