Pattern defect detection device and a spatial frequency filter used therein
AssigneeMitsubishi Denki Kabushiki Kaisha
InventorsYoko Miyazaki, Toshimasa Tomoda, Hitoshi Tanaka, Nobuyuki Kosaka, Toyomi Ohshige
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Abstract
A spatial frequency filter used in a pattern defect detection device, including a pattern which includes a black spot having a diameter expanded by a controlled amount in comparison with the diameter of a black spot on a photosensitive plate obtained by exposure by diffracted light from a pattern on a model specimen
Claims8
A pattern defect detection device comprising:
- a stage for supporting a specimen having a repetitive pattern on the surface thereof;
- a light source for emitting coherent light,
- mirror means for directing said light to the pattern on said specimen, said mirror means including mirror angle changing means for changing the angle of reflection of said light,
- a lens for focusing light diffracted by the pattern on said specimen,
- plate holding means for holding at the back focal plane of said lens either of at least one photosensitive plate to form a spatial frequency filter, and a created spatial frequency filter including at least one plate having a pattern, and
- detection signal detect means for detecting light transmitting said spatial frequency filter as a detection signal corresponding to defection in the pattern of said specimen.
A pattern defect detection device comprising:
- a stage for supporting a specimen having a repetitive pattern on the surface thereof,
- a light source for emitting coherent light,
- mirror means for directing said light to the pattern on said specimen,
- a lens for focusing light diffracted by the pattern on said specimen,
- plate holding means for holding at the back focal plane of said lens either of at least one photosensitive plate to form a spatial frequency filter, and a created spatial frequency filter including at least one plate having a pattern, said plate holding means including moving means for moving either of at least one said photosensitive plate and said created spatial frequency filter in two dimensional directions traversing said diffracted light, and
- detection signal detect means for detecting light transmitted through said spatial frequency filter as a detection signal corresponding to detection in the pattern of said specimen.
A spatial frequency filter used in a pattern defect detection device, comprising a pattern which comprises black spots, each having a diameter expanded by a controlled amount in comparison with a corresponding black spot diameter on a photosensitive plate obtained by exposure by diffracted light from a model spectrum which contains no defects.
Dependencies are inferred from the claim text.