US 5,289,254 A · Process and apparatus for testing optical components or systems

Abstract

Process and apparatus for testing optical components (12) or systems which are contained in an apparatus consisting of a focusing optical system (1) and a space-resolving light detector (2) close to the focal plane thereof, it being provided that a source (3), containing a collimator (32), for a narrowly delimited precisely parallel light beam with a plane wavefront is moved rectilinearly in a plane parallel to the wavefront, at a plurality of positions of the source (3) the signal of the light detector (2) is determined, tilting movements of the source (3) perpendicular to the line direction are detected by an apparatus with a second collimator (52) and space-sensitive detector (51), and the aperture of the optical system (1) is scanned twice with line directions rotated relative to one another through approximately 90.degree., and in addition an individual line coming close to the axis of rotation is scanned in a position rotated through approximately 45.degree..

Claims6

Dependent claims

A process for testing optical components (12) or systems (1) which are contained in an apparatus consisting of a focusing optical system (1) and a space-resolving light detector (2) close to the focal plane of the focusing optical system, wherein a source (3), containing a collimator (32) for providing a narrowly delimited and precisely parallel light beam with a plane wavefront is moved rectilinearly in a plane parallel to the wavefront, the signal of the light detector (2) being determined at a plurality of positions of the light source, tilting movements of the source (3) perpendicular to the line direction of said light beam being detected by an apparatus with a second collimator (52) and a space-sensitive detector (51), and the aperture of the optical system (1) being scanned twice along line directions rotated relative to one another through approximately 90.degree., an individual line coming close to the axis of rotation being scanned in a position rotated through approximately 45.degree..

An apparatus for testing optical components (12) or systems (1) which are contained in an apparatus consisting of a focusing optical system (1) and a space-resolving light detector (2) close to the focal plane thereof, wherein

a source (3), containing a collimator (32), for a narrowly delimited beam of parallel light with a plane wavefront is disposed on
a precision positioning device (4) with two approximately mutually orthogonal axes of linear movement (u,v), which are disposed parallel to the plane of the wavefront, and an axis of rotation (.phi.) which is approximately orthogonal thereto and
a tilt sensor apparatus (5) is provided, having a second collimator (52) and a space-sensitive detector (51), both of which are disposed at one end of a guideway for the first axis of said two axes of linear movement, and wherein
a control device (6) is connected therewith, which acts so that the aperture of the focusing optical system (1) is scanned linewise, the first axis of linear movement representing the line direction and the scanning taking place twice with a position rotated through approximately 90.degree. with respect to the axis of rotation, and in addition an individual line coming close to the axis of rotation being scanned in a position rotated through approximately 45.degree..

1 more element

Dependencies are inferred from the claim text.

Process and apparatus for testing optical components or systems

Life of this patent

Process and apparatus for testing optical components or systems

Life of this patent

Abstract

Claims6