Method of mitigating the effects of a defective electromechanical pixel
AssigneeTexas Instruments Incorporated
InventorsRichard O. Gale, Jr., Brian C. McCormack
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Abstract
Methods are disclosed by which the effects of a defective electromechanical pixel (20) having a beam (30) and a hinge (34,36) are mitigated. These methods may damage the hinge (34,36) or the beam (30) and comprise the step of applying a voltage sufficient to damage the hinge (34,36) or beam (30) of said electromechanical pixel (20) by mechanical overstress, thermal overstress, electrochemical reaction, or thermally induced chemical reaction. Other methods are also disclosed.
Claims20
A method of mitigating the effects of a bright defective electromechanical pixel which transmits light into an observer's field of view, the pixel having a beam and a hinge, comprising the step of applying a voltage sufficient to damage the electromechanical pixel in such a manner that the pixel no longer transmits said light into said field of view.
Dependencies are inferred from the claim text.