Testing of integrated circuit devices on loaded printed circuit
AssigneeEverett Charles Technologies, Inc.
InventorsDavid R. Van Loan, Charles J. Johnston, Mark A. Swart
Life of this patent
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AssigneeEverett Charles Technologies, Inc.
InventorsDavid R. Van Loan, Charles J. Johnston, Mark A. Swart
Estimating the term…
Integrated circuit (IC) packages mounted on a loaded printed circuit board (PCB) are tested by a translator module by first placing a corresponding module over each package. Each module has rows of spring contacts for releasably contacting corresponding electrical leads adjacent opposite sides of the IC package. An upper surface of the module has an array of electrically conductive test pads internally connected to corresponding contacts on the module. The test pads match an array of spring probes in the test unit. The module can be a molded plastic housing with metal leaf spring contacts, or it can comprise a composite flex-circuit material with individual contacts comprising flexible spring-like metalized plastic fingers. Contacts on the test module can releasably engage the leads on the IC package directly, or they can contact separate conductive leads on the PCB adjacent the leads on the IC package. During testing, the spring probes contact the test pads on the test modules and circuit continuity is established via the electrical connections from the spring probes through the modules to the leads adjacent the IC packages. The modules translate dense in-line spacing of leads adjacent the IC packages to the oversized in-line spacing of test pads on the module. In another embodiment, the translator module is attached to a flex-circuit cable coupled to the test system electronics. The translator module is manually placed over each IC package during testing. In a further embodiment, an integrated circuit package contains a built-in test verifier system so that standard test probes can be used to test the package without use of a separate translator module.
A translator module for making contact with first and second rows of spaced apart electrical leads on a printed circuit board, to facilitate circuit verification between the leads on the board and an array of conductive pins adapted to contact the translator module, the translator module comprising:
A translator module for testing electrical continuity between spaced apart electrical leads on an external printed circuit board and an array of fixed conductive pins in an external circuit device adapted to move in and out of contact with the translator module, the translator module comprising:
A translator module for making contact with first and second rows of spaced apart leads on a printed circuit board, to facilitate circuit verification between the leads on the board and conductive pins on an external circuit device adapted for contact with the translator module, the translator module comprising:
A translator module for making contact with first and second rows of spaced apart leads on a printed circuit board, to facilitate circuit verification between the leads on the board and an array of conductive pins on an external circuit device adapted to contact the module, the translator module comprising:
A translator module for making contact with first and second rows of spaced apart leads on a printed circuit board, to facilitate circuit verification between the leads and an array of conductive pins in an external circuit device, the translator module comprising:
Dependencies are inferred from the claim text.