Crimped connector quality control method apparatus
AssigneeThe Whitaker Corporation
InventorsKarl-Heinz Gloe, Harald Biehl
Life of this patent
Estimating the term…
Abstract
The quality of a crimped connection produced by the application of a crimping force (F) to a crimping barrel (WB) of an electrical terminal (T) with a wire (W) therein, is carried out by measuring the peak value (PV) of the crimping force (F) and comparing it with a reference value. The incremental values (IV) of the crimping force are measured during its application and are stored in the form of an actual crimping force value envelope (EA). The incremental values of an ideal crimping force are measured during its application and are stored in the form of an ideal crimping force value envelope (EI). The envelopes (EA and EI) are then compared to determine the quality of the crimped connection.
Claims12
Apparatus for crimping an electrical terminal to a wire, the apparatus comprising a crimping die, an anvil mounting plate, a crimping anvil mounted on said plate, means for driving the die through cycles of operation each comprising a working stroke towards the anvil to crimp a terminal thereon to a wire and a return stroke away from the anvil, load cell snugly confined in an opening in said mounting plate for measuring only a predetermined portion of the value of the crimping force applied to the terminal during each cycle of operation, means for continuously measuring the position of the die during each cycle of operation, means for sampling and holding the results of said measurements to produce an actual crimping force value envelope, a comparator for comparing said actual envelope with an ideal crimping force value envelope and means for producing a signal indicative of the result of said comparison and thus the quality of the crimped connection between the terminal and the wire, and a microprocessor for generating a crimp quality failure signal where the incremental values of the actual envelope differ to a predetermined extent from those of the ideal envelope, the microprocessor having an inlet-outlet line for feeding said failure signal to a host computer and for receiving from the host computer, in response to said failure signal, an instruction to initiate a test crimping program, the microprocessor being responsive to such instruction to actuate the die driving means to carry out the test crimping program, to average and store the actual crimping force envelope produced by the test program and to apply the result of the test program to said inlet-outlet line, for evaluation by the host computer.
A method of monitoring the quality of a crimped connection produced by the application of a compressive crimping force to a crimping barrel of an electrical terminal with a wire therein, by means of a crimping die driven along a rectilinear path against said crimping barrel, the method comprising the steps of:
- measuring the peak value of the crimping force and comparing the peak value with a reference value;
- measuring actual incremental values of the crimping force during its application to the crimping barrel;
- storing the actual incremental values in the form of an actual crimping force envelope;
- measuring reference incremental values of an ideal reference crimping force during its application;
- storing the latter values in the form of an ideal crimping force value envelope;
- comparing said envelopes to determine the quality of said crimped connection;
- generating a crimp quality failure signal where the incremental values of the actual envelope differ to a predetermined extent from the incremental values of the ideal envelope;
- applying said failure signal to a host computer;
- receiving from the host computer in response to said failure signal, an instruction to initiate a test crimping program;
- carrying out the test crimping program;
- averaging and storing the actual crimping force envelopes produced by the test program to produce an average crimping force value envelope;
- and
- signaling the average crimping force value envelope to the host computer for evaluation thereby.
Apparatus for crimping an electrical terminal to a wire, the apparatus comprising a crimping die, an applicator plate, a crimping anvil on said plate, a rotary member for driving the die through cycles of operation each comprising a working stroke along a rectilinear path towards the anvil to crimp a terminal thereon to a wire, and a return stroke away from the anvil, a motor for driving said rotary member, a piezo-electric crystal snugly confined on all sides in an opening in said plate, for measuring only a predetermined portion of the value of the crimping force applied to the terminal during each cycle of operation, means for continuously measuring the angular position of the rotary member in turn to measure the position of said die along said rectilinear path, during each cycle of operation, means for sampling and holding the results of both of said measurements to produce an actual crimping force value envelope, a comparator for comparing said actual crimping force envelope with an ideal crimping force value envelope entered into said comparator, a microprocessor for producing a signal indicative of the result of said comparison an thus of the quality of the crimped connection between the terminal and the wire, a logic circuit actuable by the microprocessor to stop, start and control the speed of, the motor, an inlet-outlet line for connecting the microprocessor to a host computer to transmit the said indicative signal thereto for evaluation by the host computer and for receiving instructions therefrom, the microprocessor being responsive to an instruction from the host computer, to actuate the logic circuit to cause the motor to initiate a test crimping program, and to transmit the result thereof to the host computer by way of the inlet-outlet line, for evaluation by the host computer to determine whether the host computer should signal the microprocessor to actuate the logic circuit to stop the motor.
Apparatus for crimping electrical terminals to wires, the apparatus comprising;
- a crimping die;
- a crimping anvil;
- means actuable to set the crimp height of the crimping die;
- an electric motor for driving the die through cycles of operation each comprising a working stroke towards the anvil to crimp the terminal thereon to a wire and a return stroke away from the anvil;
- a logic circuit for controlling the motor and being actuable to stop the motor upon receipt of a stop signal;
- a load cell for measuring the value of the crimping force applied to the terminal during each of said cycles of operation, an encoder for continuously measuring the position of the die during each cycle of operation;
- a circuit for sampling and holding the results of said measurements to produce an actual crimping force value envelope and for holding an ideal crimping force value envelope fed into said sampling and holding circuit;
- a comparator having a first part for comparing the incremental values of said actual value envelope with corresponding incremental values of said ideal envelope, said first part having outlet means, and a second part for comparing the area defined by said actual envelope with the area defined by said ideal envelope, said second part having outlet means;
- a microprocessor having a first and a second gate therein, said first outlet means being connected to said first gate and said second outlet means being connected to said second gate, each gate having an evaluation window defining an upper signal threshold and a lower signal threshold, each gate being connected to said logic circuit, for emitting said stop signal should a predetermined proportion of signals received by said gate from said comparator lie beyond either signal threshold of the gate, the microprocessor being programmable to actuate said crimp height setting means to reset the crimp height of the die in response to a crimp height resetting instruction signal and having an inlet-outlet port for transmitting said stop signal from the microprocessor to a host computer and for receiving a crimp height resetting instruction signal from the host computer to cause the microprocessor to reset the crimp height of the die in accordance with an evaluation of the stop signal by the host computer.
In a lead-making machine, a plurality of apparatus each for crimping electrical terminals to wires, each apparatus comprising;
- a crimping die;
- a crimping anvil;
- an electrical motor for driving the die through cycles of operation each consisting of a working stroke towards the anvil to crimp a terminal on the anvil to a wire and a return stroke away from the anvil;
- a logic circuit for controlling the operation of the motor;
- a load cell for measuring the value of the crimping force applied to the terminal during each cycle of operation;
- means for continuously measuring the position of the die during each cycle of operation;
- means for sampling and holding the results of said measurements to produce an actual crimping force value envelop;
- a comparator for comparing said actual envelope with said ideal envelope;
- a microprocessor for activating said logic circuit to stop, start, and control the speed of, said motor, and for producing a failure or a success signal indicative of the result of said comparison and thus of the quality of the crimped connection between the terminal and the wire;
- the lead-making machine further comprising a host computer connected to the microprocessor of each of said crimping apparatus to receive the signals produced thereby and upon receipt of a failure signal from a respective microprocessor to cause it to actuate its associated logic circuit to initiate a test crimping program;
- and to average and store the actual crimping force envelopes produced by the test program, and said respective microprocessor to signal the result of the test program to the host computer for evaluation by the host computer to determine whether the host computer should signal said respective microprocessor to case its associated crimping apparatus to cease crimping operations.
In crimping operations, a method of monitoring the quality of crimped connections each produced by the application of a compressive crimping force to a crimping barrel of an electrical terminal with a wire therein, the method comprising the steps of:
- measuring the peak value of the crimping force and comparing the peak value with a reference value;
- measuring the incremental values of the crimping force during its application;
- storing the incremental values in the form of an actual crimping force value envelope;
- measuring the incremental values of an ideal reference crimping force during its application;
- storing the latter values in the form of an ideal crimping force value envelope;
- comparing said envelopes to determine the quality of each respective crimped connection;
- producing a crimp quality success signal or a crimp quality failure signal in dependence upon the result of each comparison;
- transmitting the failure signal to a host computer for evaluation thereby;
- receiving from the host computer in response to said failure signal, an instruction dependent upon said evaluation, to initiate a test crimping program and to average and store the actual crimping force value envelopes produced by the test crimping program to produce an average crimping force value envelope;
- and
- carrying said instruction and transmitting the resulting average crimping force value envelope to the host computer for evaluation, thereby to determine whether the host computer should issue a further instruction for the crimping operations to be terminated.
Dependencies are inferred from the claim text.