Dynamic random access memory device capable of performing test mode operation and method of operating such memory device

A dynamic random access memory device including a memory cell array having a plurality of memory cells storing information therein, said memory device including a test mode operation for determining whether the memory cells included in said memory cell array are defective or not, said test mode operation being regulated by a logic state of an externally applied status control signal for controlling the state of said memory device,

• said memory device comprising:
• means for receiving said externally applied status control signal;
• means for detecting external application of a power supply to generate a power-on detection signal;
• means responsive to said generated power-on detection signal for counting logic state changes of said externally applied status control signal and providing power-on reset after a predetermined number of logic state changes;
• and
• means for detecting the logic state of said received status control signal after said power-on reset, to generate a signal for designating a test mode, wherein
• said status control signal includes a row address strobe signal, a column address strobe signal, and a write control signal for controlling a writing into said memory device;
• said test mode operation is regulated by logic states of said row address strobe signal, said column address strobe signal and said write control signal,
• said power-on reset means includes counting means and signal applying means operatively coupled to said counting means for applying said received row address strobe signal to said counting means after the power supply is turned on.

A dynamic random access memory device including a memory cell array having a plurality of memory cells storing information therein, said memory device including a test mode operation for determining whether the memory cells included in said memory cell array are defective or not, said test mode operation being regulated by a logic state of an externally applied status control signal for controlling the state of said memory device,

• said memory device comprising:
• means for receiving said externally applied status control signal;
• means for detecting external application of a power supply to generate a power-on detection signal;
• means responsive to said generated power-on detection signal for counting logic state changes of said externally applied status control signal and providing power-on reset after a predetermined number of logic state changes;
• and
• means for detecting the logic state of said received status control signal after said power-on reset, to generate a signal for designating a test mode, wherein
• said status control signal includes a row address strobe signal, a column address strobe signal, and a write control signal for controlling a writing into said memory device;
• said test mode operation is regulated by logic states of said row address strobe signal, said column address strobe signal and said write control signal,
• said row address strobe signal is applied by a plurality of cycles for setup immediately after a power supply is turned on, and said write control signal is rendered nonactive in a setup time period;
• said power-on reset means counts said row address strobe signal of the setup time period by predetermined times and resets the memory devices to be power-on,
• said test mode instruction signal generating means includes:
• means for detecting the order of status changes of the row address strobe signal, the column address strobe signal and the write control signal received by said status control signal receiving means, and
• means responsive to at least a second rising of said row address strobe signal applied after application of a power supply voltage for activating said means for detecting the order of the status changes.

A dynamic random access memory device including a memory cell array having a plurality of memory cells storing information therein, said memory device including a test mode operation for simultaneously selecting a predetermined number of memory cells of a plurality of bits in said memory cell array, then simultaneously reading the information stored in said predetermined number of selected memory cells, and determining whether said memory device is defective or not in accordance with the read information, said test mode operation being regulated by an externally applied status control signal for controlling the state of said memory device,

• said memory device comprising:
• means for receiving said status control signal;
• means for detecting that a power supply is externally turned on, to generate a power-on detecting signal;
• means responsive to said generated power-on detection signal for counting logic state changes of said status control signal to generate a power-on reset signal after a predetermined number of logic state changes;
• means for detecting a logic state of a status control signal received after said power-on reset, to generate a signal for instructing a test mode;
• means activated in response to said test mode instructing signal and responsive to an externally applied address for simultaneously selecting said predetermined number of memory cells from said memory cell array;
• means for receiving externally applied write data;
• means differentially coupled to said means for receiving said write data, for writing said write data into said predetermined number of selected memory cells;
• means for making access to said predetermined number of selected memory cells, to read data from said data-written memory cells;
• and
• means activated in response to said test mode instructing signal, for receiving output data from said reading means to output a logic value corresponding to the received data.

A method of operating a dynamic random access memory device including a memory cell array having a plurality of memory cells storing information therein, said memory device including a test mode operation for determining whether the memory cells includes in said memory cell array are defective or not, said test mode operation being regulated by a logic state of an externally applied status control signal for controlling the state of said memory device,

• said operating method comprising the steps of:
• receiving the externally applied status control signal;
• detecting that a power supply is externally turned on, to generate a power-on detection signal;
• responsive to said generated power-on detection signal counting logic state changes of said externally applied status control signal to reset the memory device to be power-on after a predetermined number of logic state changes;
• and
• detecting the logic state of said received status control signal after said power-on reset, to generate a signal for instructing a test mode.