Apparatus for near surface nondestructive eddy current scanning of a conductive part using a multi-layer eddy current probe array

Apparatus for near surface inspection scanning of an electrically conductive part comprising:

• an eddy current probe array having a plurality of probe elements further comprising substantially identical eddy current sense elements and at least one drive element operatively connected to said sense elements such that said sense elements and said drive elements are disposed within a flexible, multi-layer, dielectric structure wherein said at least one drive element is electrically interconnected to at least one external alternating current source, said plurality of sense elements are mutually coupled to said at least one drive element through an inspection surface during scanning of said part, and said a plurality of sense elements are electrically interconnected to a select plurality of output channels in order to operatively collect scan responsive signals therefrom;
• a plurality of conductive pathways substantially located within said sense elements such that said pathways provide individual electrical interconnection to said probe elements and cooperate as transmission lines;
• and
• a substantially lossless, structurally supporting connector means operatively connected to said sense elements which cooperate to electrically interconnect said conductive pathways to external electronic devices.