US 5,251,006 AGranted

Automatic spectrophotometer calibration system

AssigneeNIRSystems Incorporated

InventorsDavid E. Honigs, Timothy G. Kelly

Life of this patent

Estimating the term…

Loading patent…

Abstract

In a spectrophotometer having an oscillating grating, an automatic calibration system is provided to ensure that the instrument constants are recomputed before each measurement of an unknown sample. In the system, whenever a reference scan is carried out, a second scan through an absorbance standard is carried out automatically and the data obtained is used to correct the instrument coefficients relating the angular position of the grating to the wavelength. The corrected coefficients are then stored to be used in the measurement of the unknown sample immediately thereafter. For near infrared spectrum measurements, the absorbance standard is a polystyrene plate. For visual measurements, the absorbance standard is a didymium plate. The didymium plate is mounted on the polystyrene plates eclipse a portion of the polystyrene plate.

Claims7

Dependent claims

In a spectrophotometer having an oscillating grating, an exit slit, said grating scanning the wavelength passing through said exit slit as said grating oscillates, a standard absorbance plate selectively positionable in the path of light passing through said exit slit, said absorbance plate exhibiting known peaks of absorbance at known wavelengths in a selected spectrum, means to detect the intensity of light passing through said exit slit and coming into contact with a sample, and means responsive to an input signal to oscillate said grating to perform a reference scan with said standard absorbance plate out of the path of the light passing through said slit, the improvement comprising calibrating means responsive to the input signal to automatically perform the following steps each time said reference scan is carried out:

(1) oscillating said grating to perform said reference scan with said standard absorbance plate out of the path of the light passing through said exit slit,
(2) measuring the intensity of the light passing through said exit slit in step (1) at each angular increment of a set of angular increments of said grating distributed through said selected spectrum,
(3) pivoting said standard absorbance plate into the path of light passing through said exit slit,
(4) oscillating said grating to perform a calibration scan with said standard absorbance plate in the path of light passing through said exit slit,
(5) measuring the intensity of the light passing through said exit slit in step (4) and optically contacting said absorbance plate at each of said angular increments,
(6) determining the absorbance (log 1/R) of said standard absorbance plate at each of said angular increments from the measurements made in step (2) and (5),
(7) determining the location of the peaks of absorbance occurring for said standard absorbance plate from the data determined in step (6),
(8) computing corrected coefficients in an equation relating angular position of said grating to wavelength passing through said exit slit from the locations of the peaks determined in step (7) and the known wavelengths at which the peaks of absorbance occur in said standard absorbance plate, and
(9) storing said corrected coefficients to be used by said instrument in measuring a transmittance or reflectance from an unknown sample.

6 more elements

A method for performing spectral analysis on a sample with a spectrometer having an oscillating grating, an exit slit wherein said grating scans the wavelength passing through said exit slit as said grating oscillates and means to detect the intensity of light passing through said exit slit and coming into contact with the sample, said method comprising performing the following steps (1) through (9) in sequence automatically each time an unknown sample is to be measured by said spectrometer:

(1) Oscillating said grating to perform a reference scan without a standard absorbance plate in the path of light passing through said exit slit,
(2) Measuring the intensity of light passing through said exit slit in step (1) at each angular increment of a set of angular increments of said grating distributed through a selected spectrum,
(3) Pivoting a standard absorbance plate into the path of light passing through the exit slit,
(4) oscillating said grating to perform a calibration scan with said standard absorbance plate in the path of light passing through said exit slit,
(5) measuring the intensity of the light passing through said exit slit in step (4) and optically contacting said absorbance plate at each of said angular increments,
(6) determining the absorbance (log 1/R) of said standard absorbance plate at each of said angular increments from the measurements made in step (2) and (5),
(7) determining the location of the peaks of absorbance occurring for said standard absorbance plate from the data determined in step (6),
(8) computing corrected coefficients in an equation relating angular position of said granting to wavelength passing through said exit slit from the locations of the peaks determined in step (7) and the known wavelengths at which the peaks of absorbance occur in said standard absorbance plate, and
(9) storing said corrected coefficients to be used by said instrument in measuring a transmittance or reflectance from an unknown sample,
(10) then positioning said unknown sample to be measured in the path of light passing through said exit slit,
(11) then oscillating said grating to perform a scan of said unknown sample, measuring the intensity of light passing through said exit slit and optically contacting said sample at each of said angular increments, and using the coefficients stored in step (9) to determine the wavelength at which the measurements from the sample are taken.

8 more elements

Dependencies are inferred from the claim text.

Facts

Application: 07/666,139Filed 7 Mar 1991
Granted: 5 Oct 1993
Term ends: Not estimatedThe source records don’t support an estimate.

Classification7 codes

G01N 21/274
Using photo-electric detection ; circuits for computing concentration: calibration, base line adjustment, drift correction
G01J 3/28
Spectrometry; Spectrophotometry; Monochromators; Measuring colours: investigating the spectrum
G01J 3/42
Investigating the spectrum: absorption spectrometry; Double beam spectrometry; Flicker spectrometry; Reflection spectrometry
G01J 2003/2879
Markers; Calibrating of scan: calibrating scan, e.g. Fabry Perot interferometer