Integrated electron optical/differential pumping/imaging signal system for an environmental scanning electron microscope
AssigneeElectroScan Corporation
InventorsGerasimos D. Danilatos, George C. Lewis
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AssigneeElectroScan Corporation
InventorsGerasimos D. Danilatos, George C. Lewis
Estimating the term…
This invention provides for an integrated electron optical/differential pumping/imaging signal detection system for an environmental scanning electron microscope (ESEM). The ESEM includes a substantially cylindrical objective lens magnetic housing containing an axially disposed vacuum liner tube and containing means for magnetically focusing a beam of electrons passing through said liner tube. An annular ring comprised of magnetic materials abuts said magnetic housing at the lower end thereof and contains at least two pumping ports therein located axially with respect to one another. At least two annular nonmagnetic diaphragms and a final magnetic annular diaphragm are attached to the annular ring at different axial locations and extending inwardly therefrom. The diaphragms define at least two interior passages which each communicate with one of the pumping ports formed in the annular ring. A combination aperture holder and electron detector is releasably received and sealed with in the central openings of the annular diaphragms. The aperture holder has apertures therein for the passage of the electron beam and gas into and out of the specimen chamber of the ESEM and the interior passages and has electron detector means associated with the lower portion thereof.
An objective lens assembly for an environmental scanning electron microscope comprising:
An environmental scanning electron microscope comprising:
An objective lens assembly for an environmental scanning electron microscope comprising means for generating and directing an electron beam through a central opening of the assembly, two generally annular diaphragms extending inwardly to said central opening which define two interior passages containing gas at different pressure, an aperture carrier having at least pressure limiting apertures positioned within the central opening of one of said diaphragms;
An objective lens assembly for an environmental scanning electron microscope comprising means for generating and directing an electron beam through a central opening, a differentially pumped aperture system being disposed within the assembly which is formed of at least two annular diaphragms extending inwardly to said central opening and defining a series of pressure chambers through which an electron beam passes, and an aperture carrier having at least two pressure limiting apertures sealed to the passage of gas therearound and being disposed within the assembly between two of said annular diaphragms, wherein said aperture carrier communicates with the pressure chambers of the differentially pumped aperture system.
An improved environmental scanning electron microscope which includes an objective lens assembly having means for generating and directing an electron beam through a central opening of the assembly, at least two annular diaphragms extending inwardly to said central opening to define a series of pressure chambers through which the electron beam passes, and an aperture carrier having at least two pressure limiting apertures formed at the central opening of said diaphragms with said carrier being releasably secured to said diaphragms.
An improved environmental scanning electron microscope including an objective lens assembly having a differentially pumped aperture system disposed within the assembly formed of at least two annular diaphragms which define a series of pressure chambers through which an electron beam passes and an aperture carrier having at least two pressure limiting apertures sealed to the passage of gas therearound and being disposed within the assembly between two of said annular diaphragms, wherein said aperture carrier communicates with the pressure chambers of the differentially pumped aperture system.
An aperture carrier adapted to be inserted within a vacuum environment of an objective lens assembly of an environmental electron scanning microscope comprising a conduit through which an electron beam passes, said conduit bound by at least two annular diaphragms of the objective lens assembly extending outwardly therefrom to define a series of pressure chambers through which the electron beam passes, and including two pressure limiting apertures at opposite ends thereof which are sealed to the passage of gas therearound and are formed at the central openings of said diaphragms, and port means in the conduit communicating with the vacuum environment.
An aperture carrier adapted to be inserted within a vacuum environment of an objective lens assembly of an environment scanning electron microscope comprising a conduit through which an electron beam passes, said conduit bound by at least two annular diaphragms of the objective lens assembly extending outwardly therefrom to define a series of pressure chambers through which the electron beam passes, and including two pressure limiting apertures at opposite ends thereof which are sealed to the passage of gas therearound and are formed at the central openings of two of said diaphragms, and port means in the conduit communicating with the vacuum environment, said aperture carrier having electron detector means formed integrally with one of the pressure limiting apertures.
An environmental scanning electron microscope comprising:
An environmental scanning electron microscope comprising:
An environmental scanning electron microscope comprising:
An environmental scanning electron microscope comprising:
An environmental scanning electron microscope comprising:
An environmental scanning electron microscope comprising:
Dependencies are inferred from the claim text.