Semiconductor device with overvoltage protective function
AssigneeKabushiki Kaisha Toshiba
InventorsMitsuhiko Kitagawa, Tetsujiro Tsunoda, Akihiko Osawa
Life of this patent
Estimating the term…
Loading patent…
AssigneeKabushiki Kaisha Toshiba
InventorsMitsuhiko Kitagawa, Tetsujiro Tsunoda, Akihiko Osawa
Estimating the term…
In a photothyristor, a main thyristor consisting of a P emitter layer, an N base layer, a P gate base layer and an N emitter layer is formed on a semiconductor substrate. Also a pilot thyristor surrounded with the main thyristor and consisting of a P emitter layer, an N base layer, a P gate base layer and an N emitter layer is formed. In the P gate base layer, a trigger light irradiation surface including the inner surface of a recess is formed on the center of the pilot thyristor. In the N base layer, a crystal defect layer is formed under the trigger light irradiation surface by the irradiation with a radiant ray. A breakdown voltage to protect the thyristor from overvoltage is controlled by the crystal defect layer.
A semiconductor device, with overvoltage protective function, comprising:
A semiconductor device, with overvoltage protective function, comprising:
A semiconductor device with overvoltage protective function, comprising:
Dependencies are inferred from the claim text.