Process for producing amorphous boron nitride of high hardness
AssigneeFirna Siegfried Golz
InventorsJorg Wildenburg, Georg Will
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Abstract
A boron nitride, of amorphous structure, which can scratch diamond, is produced from hexagonal or turbostratic boron nitride as starting material. In the process for the production of the amorphous boron nitride, the starting material is subjected to pressures above 70 Kbar and temperatures of at least 1650.degree. C. for a period sufficient for the starting material to be completely melted, followed by quenching the resulting boron nitride melt and thereafter forming grains of amorphous boron nitride. The amorphous structure of the boron nitride is determined by X-ray and electron beam investigation.
Claims7
A process for the production of boron nitride of high hardness equal to that of diamond from starting material consisting of hexagonal or turbostratic boron nitride (BN) and up to 20 wt % of a passive catalyst based on the amount of starting material (BN), wherein the starting material is subjected to pressures above 70 Kbar and temperatures of at least 1650.degree. C. or higher for long enough for the starting material to be completely melted, following which the thus obtained boron nitride melt is quenched and grains of amorphous boron nitride (aBN-2) with amorphous structure as determined by X-ray and electron beam microscopic investigation are formed.
A process for the production of boron nitride of high hardness which is sufficient to scratch diamond from starting material consisting of hexagonal or turbostratic boron nitride (BN) and up to 20 wt % of a passive catalyst based on the amount of starting material (BN), wherein the starting material is subjected to pressures above 70 Kbar and temperatures of at least 1650.degree. C. or higher for long enough for the starting material to be completely melted, following which the thus obtained boron nitride melt is quenched and grains of amorphous boron nitride (aBN-2) with amorphous structure as determined by X-ray and electron beam microscopic investigation are formed.
Dependencies are inferred from the claim text.