Method and apparatus for determining at least one characteristic of a superconductive film
AssigneeInternational Business Machines Corporation
InventorsSubhash L. Shinde, Thomas K. Worthington
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AssigneeInternational Business Machines Corporation
InventorsSubhash L. Shinde, Thomas K. Worthington
Estimating the term…
Disclosed are apparatus and method for measuring a characteristic of a film comprised of a material that is a superconductor below a critical temperature. The apparatus includes a magnetic circuit for inducing an alternating magnetic flux at a localized region of a surface of the film. The circuit includes a magnetic core (42) having a gap (44) made therein and a drive winding (46) coupled thereto. A current source (50) is coupled to the drive winding for passing an alternating current therethrough for inducing an alternating magnetic flux within the gap. Measurement circuitry (54, 56) is responsive to a current induced within the film by an entry of the magnetic flux into the film. A processor (60) is coupled to the measurement circuitry and determines a critical current density of the superconducting film within the localized region. The measurement circuitry includes a sense winding (48) that is coupled to the core and detects a magnitude of an electrical signal induced in the sense winding by the alternating magnetic flux.
Apparatus for measuring a characteristic of a film comprised of a material that is a superconductor below a critical temperature, comprising:
Apparatus as set forth in claim and further including means for translating the film relative to the determining means so that the critical current density of the film is determinable within a plurality of localized regions.
Apparatus for measuring a characteristic of a film comprised of a material that is a superconductor below a critical temperature, comprising:
A method of detecting a presence of a non-uniformity within a superconducting film, comprising the steps of:
A method for measuring a critical current density (J.sub.c) at a selected region of a superconductive film, comprising the steps of:
A method for measuring a critical temperature (T.sub.c) at a selected region of a superconductive film, comprising the steps of:
Apparatus for detecting a presence of a non-uniformity within a superconducting film, comprising:
Apparatus for measuring a critical temperature (T.sub.c) at a selected region of a superconductive film, comprising:
Dependencies are inferred from the claim text.