Conductivity modulated field effect transistor with optimized anode emitter and anode base impurity concentrations
AssigneeKabushiki Kaisha Toshiba
InventorsAkio Nakagawa, Hiromichi Ohashi
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AssigneeKabushiki Kaisha Toshiba
InventorsAkio Nakagawa, Hiromichi Ohashi
Estimating the term…
A COM switching device includes an n.sup.+ -type layer formed on a p.sup.+ -type layer, p.sup.+ -type regions formed in the surface areas of an n.sup.- -type layer formed on the n.sup.+ -type layer, n.sup.+ -type regions formed in the surface areas of the p.sup.+ -type regions, and a gate electrode formed on an insulating layer over the surface areas of the p.sup.+ -type regions which lie between the n.sup.+ -type regions and the n.sup.- -type layer. The n.sup.+ -type layer is formed such that the amount of impurities per unit area is between 5.times.10.sup.13 cm.sup.-2 and 1.times.10.sup.15 cm.sup.-2, and the p.sup.+ -type layer is formed to have an impurity concentration between 2.times.10.sup.18 and 8.times.10.sup.18 cm.sup.-3.
A conductivity modulated semiconductor device comprising:
A conductivity modulated semiconductor device comprising:
Dependencies are inferred from the claim text.