System and method for ranking and extracting salient contours for target recognition
AssigneeTexas Instruments Incorporated
InventorKashi Rao
Life of this patent
Estimating the term…
Abstract
A system and method for obtaining salient contours from two-dimensional images acquired by a sensor is disclosed which process the two-dimensional images with an edge detector to produce edgels from each of the images, link the edgels into lists known as contours, compute a saliency value for each of the contours, rank the contours in decreasing order of saliency, and select certain ones of the ranked contours based on the requirements of a particular vision application.
Claims20
A method for obtaining salient contours from two-dimensional images acquired by a sensor, comprising the steps of:
- processing said two-dimensional images with an edge detector to produce edgels from each of said images;
- linking said edgels into lists known as contours;
- computing a saliency value for each of said contours;
- ranking said contours in decreasing order of saliency;
- and
- selecting predetermined ones from said ranked contours.
A system for object recognition, comprising:
- a sensor for generating an image of a scene;
- an edge detector connected to said sensor to detect edgels within said image;
- a salient contour extractor connected to receive and process said detected edgels into contours, said extractor including a processing unit for determining a saliency value for each of said contours and ranking said contours in decreasing order of saliency;
- and
- an object matching system connected to receive preselected ones of said process contours and match them to known contours of predetermined objects.
Dependencies are inferred from the claim text.