Method of producing semiconductor device
AssigneeFujitsu Limited
InventorYoshihiro Oshikawa
Life of this patent
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Abstract
A method for producing a semiconductor device including the steps of forming an insulating layer on a semiconductor substrate; forming a first layer of an electrode material on the insulating layer; introducing impurities into the semiconductor substrate through the first layer of the electrode material and the insulating layer by using an ion implanting process; forming a second layer of an electrode material on the first layer thereof; and forming on the impurity region an electrode pattern consisting of the first and the second layer of the electrode material and having the insulating layer below it by selectively etching the second and the first layer of the electrode material.
Claims8
A method for producing a semiconductor device without deteriorating an insulating layer, said method comprising the steps of:
- forming said insulating layer on a semiconductor substrate having a single conductivity type, the insulating layer having a specified thickness;
- forming a first layer of an electrode material on the insulating layer, the first layer having a selected thickness;
- forming a masking layer having an opening on said first layer;
- selectively introducing impurities into the semiconductor substrate via said opening and through said first layer and said insulating layer by using opposite conductivity type ion implanting to form an impurity region having an opposite conductivity type from that of said semiconductor substrate;
- forming a second layer of an electrode material on the first layer and in direct contact therewith, said second layer having, with said first layer, a sufficient thickness to form an electrode;
- and
- forming, on the impurity region, an electrode pattern, which comprises the first and second layer of the electrode material coextending over the insulating layer and forming a single level electrode or wiring, by selectively etching the second and first layer of the electrode material, said specified thickness of said insulating layer and said selected thickness of said first layer having a combined thickness to permit passage of boron ions and arsenic ions therethrough to achieve a specified depth of a boron region and a selected depth of an arsenic region in said substrate, wherein said first and second layers consist essentially of the same material;
- and wherein in said step of forming a first layer of an electrode material on the insulating layer, said first layer of an electrode material is formed with a thickness in the range of 500 to 700 .ANG..
A method for producing a semiconductor device without deteriorating an insulating layer, said method comprising the steps of:
- forming said insulating layer on a semiconductor substrate having a single conductivity type, the insulating layer having a specified thickness in a range of 50 to 300 .ANG.;
- forming a first layer of an electrode material on the insulating layer, the first layer having a selected thickness in a range of 500 to 700 .ANG.;
- forming a masking layer having an opening on said first layer;
- selectively introducing impurities into the semiconductor substrate via said opening and through said first layer and said insulating layer by using opposite conductivity type ion implanting to form an impurity region having an opposite conductivity type from that of said semiconductor substrate;
- forming a second layer of an electrode material on the first layer and in direct contact therewith, said second layer having a thickness in a range of 3,000 to 4,000 .ANG. and having, with said first layer, a sufficient thickness to form an electrode;
- and
- forming, on the impurity region, an electrode pattern, which comprises the first and second layer of the electrode material coextending over the insulating layer and forming a single level electrode or wiring, by selectively etching the second and first layer of the electrode material, said specified thickness of said insulating layer and of said first layer having a combined thickness to permit passage of boron ions and arsenic ions therethrough to achieve a specified depth of a boron region and a selected depth of an arsenic region in said substrate, wherein said first and second layers consist essentially of the same material.
Dependencies are inferred from the claim text.