Floating head probe
AssigneeUnited Technologies Corporation
InventorsJay M. Amos, David A. Raulerson
Life of this patent
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Abstract
A probe for inspecting contoured surfaces by transmitting and receiving eddy currents includes a shaft disposed in spatial relationship with the contoured surface and a pivotal probe manipulator rotatably mounted on the end of the shaft and having a critical dimension including the location of the pivot point and the width of the probe manipulator and spring means urging the probe manipulator against the contoured surface so that the probe travels along the surface and rotates substantially .+-.90 degrees relative to the shaft.
Claims7
A probe for inspecting a contoured surface having a generally cylindrical hollow shaft having a distal end, a manipulator including a pivot for being pivotally mounted on said shaft at said distal end, and a sensor supported in a recess centrally formed in said manipulator and having a face adapted to engage a contoured surface intended to be inspected, a fixed support member for said hollow shaft for locating said probe in spatial relationship relative to said contoured surface, including means for permitting movement of said probe at a constant distance from a given point of contact with said contoured surface, spring means biasing said manipulator urging the outer face of said sensor in contact with said contoured surface, the distance from the outer end of said manipulator to said pivot being selected to permit said manipulator to rotate substantially equal to .+-.90 degrees while said sensor maintains its contact throughout its travel, and means for connecting said probe through said hollow shaft and a central hole in said manipulator to a transmitter and receiver to transmit and receive signals indicative of the acceptability of the part being inspected.
Dependencies are inferred from the claim text.