Connector assembly for testing integrated circuit packages

A connector for use primarily in testing an integrated circuit package having a substantially rectangular shape with an upper surface, a lower surface, and four lateral edges with at least one of said lateral edges having a plurality of electrical leads extending therefrom, said connector comprising:

• a connector housing having a substantially rectangular recess adapted to fit over said integrated circuit package;
• at least one comb made of an insulative material having a plurality of teeth extending laterally inward from said connector housing into said recess with predefined spacing between each pair of adjacent teeth, said teeth being adapted for removable insertion between said leads when said connector housing is fitted over said integrated circuit package;
• a leadframe assembly attached to said connector housing within said recess having:
• (a) a layer of insulating material having lateral edges substantially in vertical alignment with said lateral edges of said integrated circuit package, and further having a plurality of holes in a predetermined pattern;
• and
• (b) a conductive metallic layer defining a plurality of signal traces extending from said holes in said insulating layer beyond said lateral edges of said insulating layer to form a plurality of downwardly extending test leads, each of said test leads extending into one of said spaces between said teeth to make electrical contact with a corresponding one of said integrated circuit package leads when said connector housing is fitted over said integrated circuit package;
• an elastomeric pad positioned between said connector housing and said test leads, adapted to exert an inward biasing force against said test leads to maintain electrical contact between said test leads and said integrated circuit package leads;
• a flexible cable having a plurality of connectors extending in parallel from said connector housing to a second connector adapted to provide electrical connections with external testing equipment;
• and
• a plurality of conductive pins mounted in said holes in said insulating layer adapted to provide electrical interconnections between a predetermined set of said signal traces of said leadframe assembly and a predetermined set of said cable conductors.