Computer-implemented method and system for precise temperature control of a device under test

A temperature forcing system, comprising:

• a thermal test head including a shroud for enclosing a device-under-test (DUT) in a temperature controlled environment;
• an air supply system;
• means for coupling temperature forced air from the air supply system through the thermal test head to said DUT;
• first sensing means for measuring the temperature (T0) of said forced air;
• second sensing means for measuring the temperature (T1) of said DUT;
• control means for managing the air supply system to raise and lower the temperature of said forced air in a closed loop process including the first and second sensing means to force the temperature of said DUT to a setpoint temperature;
• and
• variable compensation means for damping the control means by a factor Q that is equal to a constant (k) times the difference in DUT temperature and the air temperature wherein control convergence on said setpoint temperature by said DUT is critically damped and does not overshoot.