Combined sense amplifier and latching circuit for high speed roms
AssigneeInternational Business Machines Corporation
InventorsFrancis Bredin, Thierry Cantiant, Pierre Coppens
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AssigneeInternational Business Machines Corporation
InventorsFrancis Bredin, Thierry Cantiant, Pierre Coppens
Estimating the term…
A combined sense amplifier and latching circuit receives an input signal (VIN) at an input terminal (22). A sense amplifier includes a gated-loop type master latch (ML) having two cascaded inverters (I12, I13) with a common node (I) coupled therebetween and a control device (TG4) in the master latch loop controlled by a gating signal (55A). A reference voltage generator generates a reference voltage (VREF). The two inverters are biased between a first supply voltage (Vdd) having a magnitude greater than the reference voltage and either a second supply voltage (GND) or the reference voltage depending on the value of the gating signal. The input terminal is connected to the input of one of the inverters. A gated-loop slave latch (SL) is connected in series with the sense amplifier and includes two cascaded inverters (I14, I15) with a common node (M) coupled therebetween and a control device (P15) in the slave latch loop controlled by the gating signal. The sense amplifier and the slave latch are isolated from each other by a control device (TG5) controlled by the gating signal.
A combined sense amplifier and latching circuit (21) comprising:
A combined sense amplifier and latching circuit comprising:
A circuit for sensing data contained in an integrated memory circuit comprising:
Dependencies are inferred from the claim text.