Noise reduction in negative-ion quadrupole mass spectrometry
AssigneeNone recorded
InventorPhilippe Chastagner
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AssigneeNone recorded
InventorPhilippe Chastagner
Estimating the term…
A quadrupole mass spectrometer (QMS) system having an ion source, quadrupole mass filter, and ion collector/recorder system. A weak, transverse magnetic field and an electron collector are disposed between the quadrupole and ion collector. When operated in negative ion mode, the ion source produces a beam of primarily negatively-charged particles from a sample, including electrons as well as ions. The beam passes through the quadrupole and enters the magnetic field, where the electrons are deflected away from the beam path to the electron collector. The negative ions pass undeflected to the ion collector where they are detected and recorded as a mass spectrum.
A mass spectrometer for isotopic analysis of a sample, said spectrometer comprising:
A mass spectrometer, for isotopic analysis of a sample, said spectrometer comprising:
A method for reducing background noise in quadrupole mass spectrometric measurements of samples that produce a beam of negative ions, said beam containing electrons having a random energy distribution, said method comprising the step of deflecting said electrons away from said path, whereby said electrons are substantially removed from said beam.
Dependencies are inferred from the claim text.
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Details: magnetic deflection
Electric discharge tubes or discharge lamps
Term ended 27 Dec 2011 (estimated)
USPTO file history isn’t available for this patent, so only indexed dates are shown.
1. Field of the Invention
The present invention relates to mass spectrometry. In particular, the present invention relates to noise reduction in negativeion quadrupole mass spectrometry.
2. Discussion of Background
In the drawings,
FIG. 1 is a schematic view of a quadrupole mass spectrometer system;
FIG. 2 is a cross-sectional view of a quadrupole mass spectrometer system through plane A of FIG. 1;
Referring now to FIG. 3A, there is shown a schematic view of an apparatus according to a preferred embodiment of the present invention. Quadrupole mass spectrometer 80 includes ion source 82, quadrupole mass filter 84 (similar to quadrupole 14 of QMS system 10 above) and ion collector/recorder system 86. Ion source 82 produces ionized particles from a sample by some convenient means. Interposed between quadrupole 84 and ion collector 86 is a magnetic field, indicated generally at 90.
When QMS 80 is operated in negative ion mode, ion source 82 produces primarily negatively-charged particles, including electrons as well as ions. These particles are formed into incident beam 92, accelerated by an electric field (not shown), and passed through quadrupole 84, emerging as beam 94. Beam 94 may include additional electrons and ions, generated by collisions between particles, collisions with the rods of quadrupole 84, and so forth. As noted above, the electrons exiting quadrupole 84 are largely uncollimated and have a random energy distribution. Beam 94 enters magnetic field 90, where electrons 96 are deflected away from the path of beam 94 to electron collector 98. Magnetic field 90 is transverse to the path of beam 94, with field strength sufficient to deflect electrons 96 from beam 94, but weak enough that the heavier negative ions 100 are undeflected. Magnetic field 90 is preferably in a plane perpendicular to that of the figure as shown. Negative ions 100 pass to ion collector 86 where they are detected and recorded as a mass spectrum.
The radius of curvature of a charged particle moving with velocity v in a magnetic field H is