Method of operation of electron cyclotron resonance plasma source
AssigneeApplied Microwave Plasma Concepts, Inc.
InventorRaphael A. Dandl
Life of this patent
Estimating the term…
Loading patent…
AssigneeApplied Microwave Plasma Concepts, Inc.
InventorRaphael A. Dandl
Estimating the term…
A method is disclosed employing electron cyclotron resonant (ECR) heating to produce plasma for applications including but not limited to chemical vapor deposition and etching. A magnetic field is formed by magnets circumferentially arranged about a cylindrical and symmetrical chamber with microwave power injected perpendicularly to a longitudinal axis of the chamber for preventing line-of-sight communication of resulting energetic electrons through an outlet at one axial end of the chamber. The circumferential magnets in the symmetrical chamber cause precessing of the electrons resulting in greatly increased plasma density and ion flux or current density even at low gas pressures which are preferably maintained for establishing unidirectionality or anisotropic plasma characteristics. A magnetic field free region is formed between the plasma forming region containing the microwave power source and the circumferential magnets in order to also produce uniformity of plasma distribution in a plasma stream approaching the outlet. Thus, with specimens arranged in communication with the outlet, the above characteristics are maintained for the plasma stream over substantial transverse dimensions larger than the specimen.
A method of generating plasma by electron cyclotron resonant (ECR) heating to treat specimens by processes including chemical vapor deposition and etching, comprising the steps of
A method for producing a high density plasma by an electron cyclotron resonance (ECR) comprising
Dependencies are inferred from the claim text.