Solid-state imaging device with improved photodetector
AssigneeMitsubishi Denki Kabushiki Kaisha
InventorsShigeto Maegawa, Kiyohiko Sakakibara, Hidekazu Yamamoto
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AssigneeMitsubishi Denki Kabushiki Kaisha
InventorsShigeto Maegawa, Kiyohiko Sakakibara, Hidekazu Yamamoto
Estimating the term…
A solid-state imaging device includes a photodetector having a first conductivity type semiconductor layer, a second conductivity type semiconductor region in the layer, and a first conductivity type region in the second conductivity type region. The second conductivity type semiconductor region includes second conductivity type subregions having different dopant impurity concentrations. The subregion which contacts the first conductivity type region has a dopant impurity concentration higher than the second conductivity type subregion. The device reads out photogenerated charges stored in the second conductivity type region as a light signal. The junction capacitances between the second conductivity type semiconductor region and the first conductivity type layer and the first conductivity type region are increased so that the maximum quantity of stored charge when the first conductivity type region is depleted is increased without a change in the potential. In addition, the sensitivity of the imaging device is not reduced.
A solid-state imaging device comprising:
Dependencies are inferred from the claim text.