Fault simulation method
AssigneeHitachi, Ltd.
InventorsMasahiko Nagai, Hiroo Watai, Takaharu Nagumo, Kaoru Moriwaki
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AssigneeHitachi, Ltd.
InventorsMasahiko Nagai, Hiroo Watai, Takaharu Nagumo, Kaoru Moriwaki
Estimating the term…
A logic circuit to be an object for fault simulation is logically modified into a logic circuit configuration using logic gates of a predetermined basic gate form. Pin management data indicative of a correspondence of pins of the logic gates to a position of fault assumption of each of the pins prior to logic modification is formed. Logic simulation is then performed by injecting a fault logic value into the position of fault assumption of each of the pins of the gate of the logic circuit subsequent to the logic modification corresponding to each of the pins prior to the logic modification with reference to the pin management data, thereby implementing a fault simulation for detecting the fault of the logic circuit.
A fault simulation method for detecting a fault in a logic circuit comprising one or more logic gates having pins for data input and data output and functioning as an object of fault simulation, on the basis of logic simulation to be implemented by injecting a fault logic value into a position of fault assumption in the logic circuit, comprising the steps of:
Dependencies are inferred from the claim text.