Apparatus and method for testing an active matrix pixel display
AssigneeHoneywell Inc.
InventorLarry A. Nelson
Life of this patent
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AssigneeHoneywell Inc.
InventorLarry A. Nelson
Estimating the term…
Apparatus and an associated method are described for testing liquid crystal matrix displays that can be performed prior to the assembly of the display. This display procedure involves applying of square wave signal to the control elements and a sine wave signal to the input terminal of an active element associated with the pixel under test. By selection of the sine wave signal frequency, the modulation products resulting from the combination of the square wave signals and the sine wave signal fall between the components resulting from the application of the square wave signal alone. As a result of the symmetry of the modulation components, a comb filter can be used to select the modulation components. The power of the transmitted modulation products provides a figure of merit for the active element associated with the pixel. A capacitor can be included along with the active element in the matrix display which couples the output signal of each active element to a row (control terminal) electrode on the same substrate as the active element. The capacitor provides an increase in the test result signal to noise level and permits testing of the active matrix substrate prior to display assembly.
A method of testing a condition of an active element pixel wherein the active element pixel has a column drive electrode, a row drive electrode, and a common electrode, and wherein the method of testing the condition of an active element pixel comprises the steps of:
A method of testing a condition of a plurality of active element pixels wherein each active element pixel has a column drive electrode, a row drive electrode, and a common electrode, and wherein the method of testing the condition of a plurality of active element pixels comprises the steps of:
An apparatus for testing a condition of an active element pixel wherein the active element pixel has a column drive electrode, a row drive electrode, and a common electrode, and wherein the apparatus for testing the condition of an active element pixel comprises:
An apparatus for testing a condition of a plurality of active element pixels wherein each active element pixel has a column drive electrode, a row drive electrode, and a common electrode, and wherein the apparatus for testing the condition of a plurality of active element pixels comprises:
An apparatus for testing a condition of a plurality of active element pixels arranged in rows and columns wherein each active element pixel has a column drive electrode, a row drive electrode, and a common electrode, wherein all column drive electrodes in any particular column are connected to a plurality of column buses, wherein all row drive electrodes in any particular row are connected to a plurality of row buses, wherein all common electrodes in any particular row are connected to a plurality of common buses, and wherein the apparatus for testing the condition of a plurality of active element pixels comprises:
Dependencies are inferred from the claim text.