Sample supply device and sample inspection apparatus using the device
AssigneeCanon Kabushiki Kaisha
InventorsYoshito Yoneyama, Yoshiyuki Toge, Naoki Yuguchi
Life of this patent
Estimating the term…
Abstract
A sample supply device includes first and second sample supply means for independently receiving respective samples via a common channel and for supplying the samples to an inspection position. The device is controlled so that the second sample supply means performs a sample receiving operation and/or a washing operation with the channel, while the first sample supply means supplies the sample to the inspection position. A sample inspection apparatus inspects the sample at the inspection position principally using an optical method.
Claims32
A sample supply device comprising:
- a sample receiving channel for receiving a plurality of samples from a source;
- a sample supply channel for supplying the samples to a position to be supplied;
- first and second sample storage means for storing respective samples;
- first and second pressurizing means, in communication with said first and second sample storage means, respectively, for extruding and aspirating samples stored in said first and second storage means;
- and
- channel switching means capable of switching between a first mode and a second mode, with the first mode being a state in which said first sample storage means is connected to said sample suppy channel and said second sample storage means is connected to said sample receiving channel, and the second mode being a state in which said first sample storage means is connected to said sample receiving channel and said second sample storage means is connected to said sample supply channel.
A sample supply device comprising:
- first and second sample supply means for independently receiving samples via a common sample receiving channel and for supplying the sample to a position to be supplied;
- and
- control means for controlling said supply means so that said second sample supply means can either receive a sample from said sample receiving channel or wash said sample receiving channel while said first sample supply means supplies the sample to the position to be supplied.
A sample inspection apparatus comprising:
- a sample receiving channel for receiving a plurality of samples from a source;
- a sample supply channel for supplying the samples to an inspection position;
- first and second sample storage means for storing respective samples;
- first and second pressurizing means in communication with said first and second sample storage means, respectively, for extruding and aspirating samples stored in said first and second storage means;
- channel switching means capable of switching between a first mode and a second mode, with the first mode being a state in which said first sample storage means is connected to said sample supply channel and said second sample storage means is connected to said sample receiving channel, and the second mode being a state in which said first sample storage means is connected to said sample receiving channel and said second sample storage means is connected to said sample supply channel;
- and
- inspection means for inspecting the sample supplied to the inspection position by said sample supply channel.
A sample inspection apparatus comprising:
- first and second sample supply means for independently receiving samples via a commom sample receiving channel and for supplying the samples to an inspection position;
- control means for controlling said supply means so that said second sample supply means can either receive a sample from said sample receiving channel or clean said sample receiving channel while said first sample supply means supplies the sample to the inspection position;
- and
- inspection means for inspecting the sample supplied at the inspection position.
Dependencies are inferred from the claim text.