# US 5,181,156 A · Micromachined capacitor structure and method for making

> Agents: this data is available as JSON from the patentgrep API and MCP server — see https://patentgrep.com/llms.txt

- Number: US 5,181,156 A
- Document ID: US5181156A
- Status: Granted
- Kind: A
- Application number: 07/883,324
- Filed: 1992-05-14
- Granted: 1993-01-19
- Earliest claimed: 1992-05-14
- Assignees: Motorola, Inc.
- Inventors: Ronald J. Gutteridge; Ljubisa Ristic
- Web page: https://patentgrep.com/patent/US5181156A

## CPC

- H01G 5/18: due to change in inclination, e.g. by flexing, by spiral wrapping
- B82Y 15/00: Nanotechnology for interacting, sensing or actuating, e.g. quantum dots as markers in protein assays or molecular motors
- G01P 15/125: by capacitive pick-up
- G01P 2015/0828: {the mass being of the paddle type being suspended at one of its longitudinal ends}
- H01G: CAPACITORS; CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES, LIGHT-SENSITIVE OR TEMPERATURE-SENSITIVE DEVICES OF THE ELECTROLYTIC TYPE (selection of specified materials as dielectric H01B3/00; capacitors having potential barriers H10D1/62, H10K10/10)
- B82Y: SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- G01P: MEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION, OR SHOCK; INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT (measuring or recording blood flow A61B5/02, A61B8/06; monitoring speed or deceleration of electrically-propelled vehicles B60L3/00; vehicle lighting systems adapted to indicate speed B60Q1/54; determining position or course in navigation, measuring ground distance in geodesy or surveying G01C; combined measuring devices for measuring two or more variables of movement G01C23/00; measuring velocity of sound G01H; measuring velocity of light G01J7/00; measuring direction or velocity of solid objects by reception or emission of radiowaves or other waves and based on propagation effects, e.g. Doppler effect, propagation time, direction of propagation, G01S; measuring speed of nuclear radiation G01T; measuring acceleration of gravity G01V; {measuring or recording the speed of trains B61L23/00; speed indicators incorporated in motor vehicles B60K35/00; measuring frequency or phase G01R; traffic control G08G})

## Abstract

A micromachined capacitor structure having integral travel stops (19, 22, 22') within an active region of the capacitor is provided. The capacitor structure is formed on a substrate (11) and includes a moving capacitor plate (15) supported by one or more flexing arms (17) mechanically anchored to the substrate (11). The moving capacitor plate (15) has an active region (15) substantially parallel to the substrate (11) and separated from the substrate (11) by a first spacing. A corrugation (19) is formed in the moving capacitor plate (15) over the substrate (11) and separated from the substrate (11) by a second spacing, wherein the second spacing is smaller than the first spacing.

## Claims

### Claim 1

A method for forming travel limit stops in a micromachined capacitor structure comprising the steps of:
providing a substrate having a top surface; covering the top surface with a first silicon nitride layer;
forming a first polysilicon layer on the first silicon nitride layer,
patterning the first polysilicon layer to form a first anchor and a lower capacitor plate, wherein portions of the first silicon nitride layer are exposed by the patterning step;
covering the first patterned polysilicon and the exposed portions of the first silicon nitride with a first sacrificial layer comprising silicon oxide;
covering the first sacrificial layer with a second silicon nitride layer;
covering the second silicon nitride layer with a second sacrificial layer comprising silicon oxide;
etching a first hole in the second sacrificial layer, the second silicon nitride, and the first sacrificial layer to expose the first anchor;
etching a second hole in the second sacrificial layer over the lower capacitor plate;
forming a second polysilicon layer that fills the first and second holes and covers the second sacrificial layer;
patterning the second polysilicon layer to form a middle capacitor plate that is mechanically attached to the anchor, has a portion spaced from the lower capacitor plate by the thickness of the first and second sacrificial layers together with the second silicon nitride layer, and a travel stop portion which is spaced from the lower capacitor plate by the thickness of the first sacrificial layer and the second silicon nitride layer; and
performing a sacrificial etch of the first and second sacrificial layers using an isotropic etchant that etches the silicon oxide faster than silicon nitride, wherein only a portion of the second silicon nitride layer which is covered by the travel stop portion remains after the sacrificial etching.

### Claim 2 (depends on 1)

The method of claim 1 wherein the step of patterning the first polysilicon layer also forms a second anchor, and the method further comprising the steps of: before the sacrificial etching step,
covering the middle capacitor plate with a third sacrificial layer comprising silicon oxide;
covering the third sacrificial layer with a third silicon nitride layer;
covering the third silicon nitride layer with a fourth sacrificial layer comprising silicon oxide;
etching a third hole in the fourth sacrificial layer, the third silicon nitride, and the third sacrificial layer to expose the second anchor;
etching a fourth hole in the fourth sacrificial layer over the middle capacitor plate;
forming a third polysilicon layer that fills the third and fourth holes and covers the fourth sacrificial layer; and
patterning the third polysilicon layer to form an upper capacitor plate that is mechanically attached to the second anchor, has a portion spaced from the middle capacitor plate by the thickness of the third and fourth sacrificial layers together with the third silicon nitride layer, and a travel stop portion which is spaced from the middle capacitor plate by the thickness of the third sacrificial layer and the third silicon nitride layer.

### Claim 3 (depends on 1)

The method of claim 1 wherein the first sacrificial layer is approximately 1.0 micrometer thick, the second silicon nitride layer is approximately 0.3 micrometer thick, and the second sacrificial layer is approximately 1.0 micrometer thick.

### Claim 4 (depends on 1)

The method of claim 1 wherein the portion of the second silicon nitride layer which remains after the sacrificial etching is approximately half of the original thickness of the second silicon nitride layer.

### Claim 5 (depends on 1)

The method of claim 1 wherein the step of patterning the first polysilicon layer further comprises the step of forming a landing pad that is electrically isolated from the lower capacitor plate and the anchor, and the second hole is formed over the landing pad.

### Claim 6

A method for forming travel limit stops in a micromachined capacitor structure comprising: providing a substrate having a top surface; forming a plurality of polysilicon anchors on the top surface; forming a lower capacitor plate on the top surface, wherein the lower capacitor plate has an active portion and a landing pad portion; covering the top surface, the anchors, and the lower capacitor plate with a sacrificial layer; etching a first set of holes extending through the sacrificial layer to expose the anchors; etching a second set of holes extending partially through the sacrificial layer and positioned over the landing pad portion of the lower capacitor plate; forming a middle polysilicon capacitor plate on the sacrificial layer and extending into the first and second sets of holes, wherein the middle capacitor plate is mechanically attached to at least one anchor through the first set of holes and has dimples where the capacitor plate extends into the second set of holes; and etching the sacrificial layer to provide an air gap between the capacitor plate and the substrate.

### Claim 7 (depends on 6)

The method of claim 6 wherein the landing pads portions are electrically isolated from the anchors and the active portion of the lower capacitor plate.

### Claim 8 (depends on 6)

The method of claim 6 wherein before the step of etching the sacrificial layer the method further comprises the steps of forming a second sacrificial layer covering the middle polysilicon capacitor plate and the anchors; etching a third set of holes extending through the second sacrificial layer to expose an anchor; etching a fourth set of holes extending partially through the second sacrificial layer, wherein each of the fourth set of holes surrounds one of the third set of holes and extends over the middle capacitor plate; forming an upper polysilicon capacitor plate mechanically attached to the anchor through the third set of holes and extending over the middle capacitor plate; and forming an upper travel stop comprising polysilicon attached to at least one of the anchors through the fourth set of holes, wherein the upper travel stop is electrically isolated from the upper capacitor plate, the middle capacitor plate, and the lower capacitor plate.

### Claim 9 (depends on 6)

The method of claim 6 wherein before the step of etching the sacrificial layer the method further comprises the steps of forming a second sacrificial layer covering the middle polysilicon capacitor plate and the anchors; etching a third set of holes extending through the second sacrificial layer to expose an anchor; etching a fourth set of holes extending partially through the second sacrificial layer, wherein each of the fourth set of holes is positioned over the middle capacitor plate; forming an upper polysilicon capacitor plate mechanically attached to the anchor through the third set of holes and extending over the middle capacitor plate, wherein a portion of the upper capacitor plate extends into at least one of the fourth set of holes to to form an upper travel stop.

### Claim 10

A micromachined capacitor structure having a travel limit stop, the structure comprising: a substrate; a moving capacitor plate having an active area separated from the substrate by a first spacing and mechanically attached to the substrate by at least one anchor region, wherein the active region is substantially parallel to the substrate; and a corrugation formed in the second capacitor plate, wherein the corrugation has a bottom surface located over the substrate and separated from the substrate by a second spacing, wherein the second spacing is smaller than the first spacing.

### Claim 11 (depends on 10)

The micromachined capacitor structure having a travel limit stop of claim 10 further comprising a dielectric coating on the bottom surface of the corrugation.

### Claim 12 (depends on 11)

The micromachined capacitor structure of claim 11 wherein the dielectric coating comprises silicon nitride.

### Claim 13 (depends on 12)

The micromachined capacitor structure of claim 12 further comprising: an upper capacitor plate formed over the moving capacitor plate and separated from the moving capacitor plate by a third spacing and mechanically attached to the substrate; and a corrugation formed in the upper capacitor plate, wherein the corrugation has a bottom surface positioned over the moving capacitor plate and spaced from the moving capacitor plate by a fourth spacing, wherein the fourth spacing is smaller than the third spacing.

### Claim 14 (depends on 12)

The micromachined capacitor structure of claim 12 further comprising: an upper capacitor plate formed over the moving capacitor plate and separated from the moving capacitor plate by a third spacing and mechanically attached to the substrate; and a polysilicon travel stop having a bottom surface positioned over the moving capacitor plate and spaced from the moving capacitor plate by a fourth spacing, wherein the fourth spacing is smaller than the third spacing and the polysilicon travel stop is electrically isolated from the lower, moving, and upper capacitor plates.

### Claim 15 (depends on 11)

The micromachined capacitor structure of claim 11 further comprising a lower capacitor plate formed in or on the substrate beneath the active region of the moving capacitor wherein a portion of the lower capacitor plate located underneath the corrugation serves as a landing pad for the bottom surface of the corrugation.

### Claim 16 (depends on 10)

The micromachined capacitor structure of claim 10 further comprising a lower capacitor plate formed in or on the substrate beneath the active region of the moving capacitor plate and a landing pad formed on the substrate underneath the corrugation.

### Claim 17

A micromachined capacitor structure comprising: a substrate; a first capacitor plate formed on the substrate; a second capacitor plate supported by at least one flexing arm and having an active area formed over the first capacitor plate, an anchor area mechanically attached to the substrate and spaced away from and electrically isolated from the first capacitor plate, and a flexure portion mechanically coupling the active area to the anchor portion; and a plurality of corrugations formed in the active area of the second capacitor plate, wherein the corrugations make the active portion more rigid in at least one dimension than the flexure portion.

### Claim 18 (depends on 17)

The micromachined capacitor structure of claim 17 wherein each corrugation extends radially from a center of the active area to an edge of the active area.