Apparatus for conducting a refractory metal deposition process
AssigneeLSI Logic Corporation
InventorKeith J. Hansen
Life of this patent
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AssigneeLSI Logic Corporation
InventorKeith J. Hansen
Estimating the term…
In one embodiment, an apparatus programmed to automatically form a barrier layer for contacting a metal interconnect layer to one or more exposed N and P type silicon regions on a wafer. The wafer is heated with a direct radiation source, such as a lamp. To equalize the differing emissivities of the N type and P type silicon regions, an opaque layer of refractory metal is first formed on the regions at a temperature below approximately 100.degree. C. A refractory metal deposition process is then conducted at temperatures between 230.degree. C.-425.degree. C. During this higher temperature deposition process, the reducing gas is ramped up with time to increase the deposition rate of the refractory metal as the exothermic reducing reactions increasingly heat the contact areas. Other process and apparatus features enable higher bonding strength between the silicon surface and the formed barrier layer contacting the silicon surface and enable a higher purity content of the processing gases as well as improved diffusion of processing gases when injected into the processing chamber.
An apparatus for forming a barrier layer for electrically contacting a conductive interconnect layer to one or more exposed N and P type silicon regions on a wafer, said apparatus comprising:
An apparatus for forming a barrier layer for electrically contacting a conductive interconnect layer to one or more exposed silicon regions on a wafer, said apparatus comprising:
An apparatus for forming a barrier layer for electrically contacting a conductive interconnect layer to one or more exposed silicon regions on a wafer, said apparatus comprising:
An apparatus for forming a conductive via in contact with a polysilicon layer for providing electrical contact between said polysilicon layer and a metal layer, said polysilicon layer being formed on a wafer, said apparatus comprising:
An apparatus for forming a conductive via in contact with a first metal layer for providing electrical contact between said first metal layer and a second metal layer, said first metal layer being formed on a wafer, said apparatus comprising:
Dependencies are inferred from the claim text.