Method and apparatus for setting desired logic state at internal point of a select storage element
AssigneeCrossCheck Technology, Inc.
InventorsKerry M. Pierce, Thomas V. Ferry
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AssigneeCrossCheck Technology, Inc.
InventorsKerry M. Pierce, Thomas V. Ferry
Estimating the term…
An IC having a test grid structure including intersecting probe lines and control/sense lines is used to apply desired logic states directly to internal transmission paths of select storage elements. A switch is located at each intersection for conducting the desired logic state to the internal transmission path. To achieve overwriting and storage of the desired logic state, the conventional storage element is modified to include a transmission gate activated by an overwrite enable signal. The overwrite enable signal is defined by one or more probe lines. To overwrite the contents of a storage element, the storage element is selected by turning on the switch with a probe line coupled to such switch, while the included transmission gate is disabled by receiving the overwrite enable signal. The logic state of the control/sense line is conducted into the storage element to the included transmission gate where it overwrites the current contents and is stored.
A method for overwriting storage contents of a storage element in an integrated circuit, said storage element having an input for receiving logic signals, by writing a desired logic state to a internal transmission path of the storage element, the method comprising the steps of:
A method for overwriting the contents of a first storage element among a plurality of storage elements including said first storage element and a second storage element, said first storage element selectable with a first probe signal, said second storage element selectable with a second probe signal, the method comprising the steps of:
An apparatus for setting a desired logic state at a first storage element of a plurality of storage elements including said first storage element and a second storage element, said first storage element selectable for receiving said desired logic state with a first probe signal, said second storage element selectable with a second probe signal, the apparatus comprising:
Dependencies are inferred from the claim text.