Simultaneous multibeam scanning system
AssigneeHolotek Ltd.
InventorCharles J. Kramer
Life of this patent
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AssigneeHolotek Ltd.
InventorCharles J. Kramer
Estimating the term…
A dual, simultaneous beam scanning system for simultaneously scanning two individually modulated adjacent scan lines on an internal drum imaging surface uses a deflector which varies the angular orientation between combined orthogonally polarized beams so that one of the beams rotates about the other in synchronism with the angular position (the distance between start of scan) along the scan lines around the drum imaging surface. Signals from both a beam position sensing photodetector array and from a shaft encoder on the deflector unit, such as a Hologon deflector, controls the deflection of one of the orthogonally polarized beams so as to maintain the spacing and prevent crossovers of the adjacent scan lines and also reduce differential bow. Differential bow may be corrected both in the internal drum configuration and in a flat field imaging system using plural beam scanning. The scan lines can overlap so as to provide high resolution imaging at a rate of the order of hundreds of scan lines per second.
In a scanning system having a deflector for producing scan lines on an image surface and a scan lens having an axis focused on the image surface and disposed between said deflector and said image surface, the improvement comprising means for generating a first beam directed along said axis and a second beam tilted at an angle in the cross scan direction with respect to said lens axis, means ahead of said deflector for deflecting said second beam in said cross scan direction as a function of the scan angle for counteracting differential scan line bow.
Dependencies are inferred from the claim text.