Methods of detecting, classifying and quantifying defects in optical fiber end faces
AssigneeAT&T Bell Laboratories
InventorsJohn M. Palmquist, Arthur T. Schmidt, Behzad Shahraray
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AssigneeAT&T Bell Laboratories
InventorsJohn M. Palmquist, Arthur T. Schmidt, Behzad Shahraray
Estimating the term…
Methods are provided to detect, classify and quantify defects such as chips, pits, scratches and cracks in a polished end surface (31) of optical fiber and specifically in an end face of an optical fiber terminated by a ferrule (34). Images of the end face are acquired at each of three focal positions which collectively include all the features of interest. Information from these images is combined into a single image which is processed further. Discrepancies between the images are used to discriminate between cracks and scratches. Morphological processing is used to segment the fiber from its ferrule and a Hough transform is used to estimate the center and radius of the optical fiber, which facilitates the isolation of the fiber. Chips and pits in the fiber end face are detected and quantified by thresholding and morphological processing of the isolated fiber. Edge detection is used to detect edge segments resulting from scratches and cracks. Then the line segments are classified into scratches and cracks. The detected segments are matched to provide scratches in a final image. Quantitative measures then are used to establish standards for the quality of the polished, terminated optical fibers.
A method of detecting, classifying and quantifying defects in a polished end face of an optical fiber, said method comprising the steps of:
A method of detecting, classifying and quantifying defects in a polished end face of an optical fiber, which is terminated in a connector component, said method comprising the steps of:
A method of detecting, classifying and quantifying defects a polished end face of a terminated optical fiber, said method comprising:
Dependencies are inferred from the claim text.