Method for measuring light being coupled into and out of a light waveguide
AssigneeSiemens Aktiengesellschaft
InventorsWinfried Lieber, Gervin Ruegenberg
Life of this patent
Estimating the term…
Abstract
During an initial pressure application on a light waveguide with a coating, which waveguide is subjected to a flexional coupling, deformation of the coating will occur and the value of an outfed light from the light waveguide will change as the deformation changes. The final intensity of the outfed light is obtained during the deformation of the coating by a process of extrapolating the final value from the initial measured values occurring during the initial deformation of the coating.
Claims3
In a method for evaluating an outfed light from a light waveguide comprising providing a measuring instrument, wherein the method includes incoupling light to a light waveguide provided with a resilient coating and outcoupling light from the light waveguide, said incoupling and outcoupling including utilizing a flexional coupler which includes applying pressure for producing a curved contour of the light waveguide and measuring the amount of light coupled from the waveguide, the improvements comprising immediately measuring the light coupled from the waveguide during the application of the pressure to cause deformation of the coating of the waveguide to produce measured values, ending the measurement before reaching a final condition of the pressure-dependent deformation of the coating, and determining a final value that would be in the final condition by extrapolating from the measured values acquired during the deformation.
Dependencies are inferred from the claim text.