US 5,177,555 A · Method and apparatus for testing electrical connectors

Abstract

A method and apparatus for optically determining the distribution of normal force present at the mating surfaces of an electrical surface connector uses the birefringent properties of a photoelastic material. Photoelastic members are distributed between the two planar surfaces, and plane-polarized, narrow-band wave-length light is coupled into each member with an optical fiber. The light is directed to propagate along a principle strain axis of the photoelastic member. The temporarily birefringent photoelastic material provides a relative propagation delay between vector components of the light in each member which are perpendicular to the propagation direction. The light exiting each member is input to a plane polarizer, the output of which is measured with an intensity meter. The relative delay between the vector components creates a detectable change in intensity at the intensity meter. Correlation of the measurements for all the photoelastic members give a distribution of the forces across the planar surfaces.

Claims13

Dependent claims

A method of determining the relative quality of electrical contact across closed opposing planar surfaces of a separable two member electronic interconnect where one of the two opposing planar surfaces is resilient and has closely spaced apart electrically conductive contact bumps thereon, the method comprising:

locating a member of photoelastic material having planar exterior surfaces in pressure transfer relationship with each of the electrically conductive contact bumps on the resilient planar surface, each of such members being located to have one of its planar surfaces facing toward such resilient surface;
pressing each of the individual members of photoelastic material and its corresponding electrically conductive bump together to induce increased stress in the photoelastic material of the individual members;
coupling plane-polarized narrow-bandwidth light into the individual members of photoelastic material at 45 degrees with the direction of force orthogonal to the direction of light propagation;
and
detecting in the plane-polarized light exiting the individual members of photoelastic material the relative phase delay created by the birefringence produced in such individual members as a result of the increased force of pressing.

2 more elements

Dependencies are inferred from the claim text.

Method and apparatus for testing electrical connectors

Life of this patent

Method and apparatus for testing electrical connectors

Life of this patent

Abstract

Claims13