Contactor for testing integrated circuit chips mounted in molded carrier rings

A test fixture configured for installation within a contactor used to facilitate the connection of electrical conductor pads of an integrated circuit chip carrier package to test apparatus, said test fixture comprising:

• a spring-loaded plunger assembly for receiving the carrier package and advancing the carrier package into a test position when said plunger is depressed, said plunger including a moveable head and a stationary base linked by a reciprocating piston, said base having a groove in the perimeter thereof;
• and
• a plurality of contact members mounted to said plunger base and providing contact with the electrical conductor pads of the carrier package, each of said contact members comprising:
• a tongue dimensioned for engaging said groove of said base;
• a pair of detent projections and a pair of notches, said detent projections dimensioned and arranged for mating with notches of adjacent ones of said contact members;
• and
• a plurality of contact fingers configured for electrical engagement with the conductor pads of the carrier, each of said contact fingers including an upper portion having a protruding contact facing an inlet defined by said test fixture and a lower contact portion,
• whereby the conductor pads of the chip carrier package electrically engage said protruding contacts of said fingers when the carrier package is advanced into the test position in said inlet so that the pads of the package may be accessed by the test apparatus connected to said lower contact portion of said fingers.

A test fixture configured for installation within a contactor used to facilitate the connection of conductor pads of an integrated circuit chip carrier package to test apparatus, said test fixture comprising:

• a spring-loaded plunger assembly for receiving the carrier package and advancing the carrier package into a test position when said plunger is depressed, said plunger comprising:
• a head including a plurality of arms arranged in a cross-like configuration;
• a base with a groove around the perimeter thereof and including a cylindrical aperture with inwardly projecting tabs, said base further including cross-like recesses aligned and dimensioned for seating engagement with said arms of said head when said plunger is depressed;
• and
• a piston coupled to said head, said piston dimensioned and configured for reciprocating communication within said aperture of said base;
• and
• a plurality of contact members mounted to said plunger and providing contact with the conductor pads of the carrier package, each of said contact members comprising:
• a tongue dimensioned for frictionally engaging said groove of said base;
• a pair of detent projections and a pair of notches, said detent projections dimensioned and arranged for mating with notches of adjacent ones of said contact members;
• and
• a plurality of contact fingers configured for electrical engagement with the conductor pads of the carrier, each of said contact fingers including an upper portion having a protruding contact facing an inlet defined by said test fixture and a lower contact portion,
• whereby the conductor pads of the chip carrier package electrically engage said protruding contacts of said fingers when the carrier package is advanced into the test position in said inlet so that the pads of the package may be accessed by the test apparatus connected to said lower contact portion of said fingers.

A contactor for facilitating the connection of conductor pads of an integrated circuit chip carrier package to test apparatus, the test apparatus including ram means for supporting the carrier package and for advancing it into a test position in registration with said contactor at the beginning of a test and for retracting the carrier package from said contactor at the conclusion of the test, said contactor comprising:

• a test fixture for receiving the carrier package and for providing contact with electrical conductor pads of the carrier package, said test fixure including a plurality of contact members and a spring-loaded plunger assembly having a base portion with a groove around the perimeter thereof, each of said contact members comprising:
• a tongue dimensioned for engaging said groove of said plunger;
• a pair of detent projections and a pair of notches, said detent projections dimensioned and arranged for mating with notches of adjacent ones of said contact members;
• and
• a plurality of contact fingers configured for electrical engagement with the conductor pads of the carrier, each of said contact fingers including an upper portion having a protruding contact facing an inlet defined by said test fixture and a lower portion having a sloped contact;
• a housing unit with a cavity configured and dimensioned for encompassing said test fixture when installed therein, said housing unit further including a central aperture with a lip extending from the periphery thereof for biasing said upper portions of said contact fingers inwardly;
• and
• a contact base coupled to said housing unit, said base including a plurality of conductive portions configured and arranged for frictional engagement with said lower portions of said contact fingers, said conductive portions being connected to respective test points of said base via conductive traces,
• whereby the conductor pads of the integrated circuit chip carrier package electrically engage said protruding contacts of said fingers when the carrier package is advanced into the test position in said inlet so that the pads of the package may be accessed by the test apparatus connected to said test points.

A contactor for facilitating the connection of electrical conductor pads of an integrated circuit chip carrier package to test apparatus, the test apparatus including ram means for supporting the carrier package and for advancing it into a test position in registration with said contactor at the beginning of a test and for retracting the carrier package from said contactor at the conclusion of the test, said contactor comprising:

• a test fixture for receiving the carrier package and for providing contact with the electrical conductor pads of the carrier package, said test fixture comprising:
• A. a spring-loaded plunger assembly for receiving the carrier package and advancing the carrier package into a test position when said plunger is depressed, said plunger assembly comprising:
• a head including a plurality of arms arranged in a cross-like configuration;
• a base with a groove around the perimeter thereof and including a cylindrical aperture with inwardly projecting tabs, said base further including cross-like recesses aligned and dimensioned for seating engagement with said arms of said head when said plunger is depressed;
• and
• a piston coupled to said head, said piston dimensioned and configured for reciprocating communication within said aperture of said base;
• and
• B. a plurality of contact members mounted to said plunger and providing contact with the electrical conductor pads of the carrier package, each of said contact members comprising:
• an outer ridge;
• a tongue dimensioned for engaging said groove of said base;
• a pair of detent projections and a pair of notches, said detent projections dimensioned and arranged for mating with notches of adjacent ones of said contact members;
• and
• a plurality of contact fingers configured for electrical engagement with the conductor pads of the carrier, each of said contact fingers including an upper portion having a protruding contact facing an inlet defined by said test fixture and a lower portion having a sloped contact;
• a housing unit with a cavity configured and dimensioned for encompassing said test fixture when installed therein, said housing unit comprising:
• a rim around the periphery of said cavity, said rim arranged for seating engagement with said outer ridges of said contact members;
• and
• a central aperture with a lip extending from the periphery thereof for biasing said upper portions of said contact fingers inwardly;
• a retainer plate for restricting the movement of said test fixture within said housing unit and for providing spacing to offset the height of said lower portions of said fingers extending from said contact members, said retainer plate having an opening with a periphery dimensioned to overlap said outer ridges of said members;
• and
• a contact base coupled to said housing unit, said base including a plurality of conductive portions configured and arranged for frictional engagement with said lower portions of said contact fingers, said conductive portions being connected to respective test points of said base via conductive traces,
• whereby the conductor pads of the integrated circuit chip carrier package electrically engage said protruding contacts of said fingers when the carrier package is advanced into the test position in said inlet so that the pads of the package may be accessed by the test apparatus connected to said test points.