IC test equipment
AssigneeAdvantest Corporation
InventorsToshiyuki Kiyokawa, Noriyuki Igarashi, Hisao Hayama
Life of this patent
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Abstract
A vertical drive unit is mounted on a fixed beam provided above a performance board for testing IC elements and fixed to a support frame. An X-Y carrier head of an X-Y transport unit mounted on the support frame is movable in a planar area including space between the vertical drive unit and the performance board. The X-Y carrier head has a vertical guide, by which an air chuck for sucking up and holding an IC element is supported so that it is movable in the vertical direction. The X-Y carrier head is brought to a predetermined position above the test head, the air chuck is brought down by the vertical drive unit, and then terminals of the IC element are pressed into contact with an IC socket on the performance board at a predetermined pressure.
Claims5
IC test equipment comprising:
- a test head provided with a performance board having at least one IC socket for connection of an IC element to be tested;
- support frame means having a position fixed relative to said test head;
- an X-Y transport unit mounted on said support frame and having an X-Y carrier head horizontally movable in a region above said support frame, including space above said test head;
- air chuck means supported by said X-Y carrier capable of sucking up and holding IC elements;
- vertical guide means whereby said air chuck means is supported in a manner to be movable in the vertical direction relative to said X-Y carrier head;
- a fixed beam means provided above said test head and fixed to said support frame means;
- and
- vertical driving means mounted on said fixed beam means, for applying force to said air chuck means to move it down.
Dependencies are inferred from the claim text.